582
M. Saini et al.
modelled using Bruggeman biaxial model. The complete optical characterization of
Ag-nanoparticle arrays on rippled-Si is carried out by using Mueller matrix approach.
This study is useful in characterizing various optical properties of complex plasmonic
systems for plasmonics-based intriguing applications.
Acknowledgements Authors would like to thank Dr. T. W. H. Oates and Dr. Mukul Bhatnagar
for conducting Muller Matrix and Nanodots analysis using SE and useful contributions. Authors
would also like to thank Prof. T. Som from Institute of Physics, Bhubaneswar for his guidance and
useful discussions.
References
1. A.K. Ghatak, K. Thyagarajan, Contemporary Optics (Springer, US, Boston, MA, 1978)
2. S.B. Nurushev, M.F. Runtso, M.N. Strikhanov, Introduction to Polarization Physics, vol. 859
(Springer, Berlin, Heidelberg, 2013)
3. H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications (2007)
4. E. Collett, Field Guide to Polarization (SPIE, 2005)
5. S. Baskal, S. Baskal, in Physics of the Lorentz Group (IOP Publishing, 2015)
6. A. Derkachova, K. Kolwas, I. Demchenko, Plasmonics 11, 941 (2016)
7. S. Liu, W. Du, X. Chen, H. Jiang, C. Zhang, Opt. Express 23, 17316 (2015)
8. R.M.A. Azzam, Opt. Eng. 30, 1583 (1991)
9. S. Y. Lu, R. A. Chipman, Opt. Commun. (1998)
10. T.W.H. Oates, M. Ranjan, S. Facsko, H. Arwin, Opt. Express 19, 2014 (2011)
11. H. G. Tompkins, E. A. Irene, Handbook of Ellipsometry (2005)
12. A. F. J. Levi, A. F. J. Levi, in Essential Classical Mechanics for Device Physics (IOP Publishing,
2016)
13. D.E. Aspnes, A.A. Studna, Appl. Opt. 14, 220 (1975)
14. R.H. Muller, J.C. Farmer, Rev. Sci. Instrum. 55, 371 (1984)
15. H. G. Tompkins, A User’s Guide to Ellipsometry (Elsevier, 1993)
16. R. Gupta, M.J. Dyer, W.A. Weimer, J. Appl. Phys. 92, 5264 (2002)
17. M. Schubert, Phys. Rev. B Condens. Matter Mater. Phys. 53, 4265 (1996)
18. G.E. Jellison, Thin Solid Films 234, 416 (1993)
19. F. Wooten, Am. J. Phys. 70, 1269 (2002)
20. T.E. Tiwald, D.W. Thompson, J.A. Woollam, W. Paulson, R. Hance, Thin Solid Films 313–314,
661 (1998)
21. D.Y. Smith, M. Inokuti, W. Karstens, J. Phys. Condens. Matter 13, 3883 (2001)
22. G.E. Jellison, F.A. Modine, Appl. Phys. Lett. 69, 371 (1996)
23. A.S. Ferlauto, G.M. Ferreira, J.M. Pearce, C.R. Wronski, R.W. Collins, X. Deng, G. Ganguly,
J. Appl. Phys. 92, 2424 (2002)
24. T. C. Choy, Effective Medium Theory (Oxford University Press, 2015)
25. W. S. Wieglhofer, A. Lakhtakia (eds), Introduction to Complex Mediums for Optics and
Electromagnetics (SPIE, Bellingham, WA, USA, 2003)
26. S.A. Maier, Plasmonics: Fundamentals and Applications (Springer US, New York, NY, 2007)
27. F.J. García-Vidal, J.B. Pendry, Phys. Rev. Lett. 77, 1163 (1996)
28. A. Agrawal, I. Kriegel, D.J. Milliron, J. Phys. Chem. C 119, 6227 (2015)
29. J. Katyal, R.K. Soni, J. Mod. Opt. 60, 1717 (2013)
30. M. Ranjan, S. Facsko, M. Fritzsche, S. Mukherjee, Microelectron. Eng. 102, 44 (2013)
31. M. Ranjan, T.W.H. Oates, S. Facsko, W. Mller, Opt. Lett. 35, 2576 (2010)
32. S.A. Maier, H.A. Atwater, J. Appl. Phys. 98, 011101 (2005)
M. Saini et al.
modelled using Bruggeman biaxial model. The complete optical characterization of
Ag-nanoparticle arrays on rippled-Si is carried out by using Mueller matrix approach.
This study is useful in characterizing various optical properties of complex plasmonic
systems for plasmonics-based intriguing applications.
Acknowledgements Authors would like to thank Dr. T. W. H. Oates and Dr. Mukul Bhatnagar
for conducting Muller Matrix and Nanodots analysis using SE and useful contributions. Authors
would also like to thank Prof. T. Som from Institute of Physics, Bhubaneswar for his guidance and
useful discussions.
References
1. A.K. Ghatak, K. Thyagarajan, Contemporary Optics (Springer, US, Boston, MA, 1978)
2. S.B. Nurushev, M.F. Runtso, M.N. Strikhanov, Introduction to Polarization Physics, vol. 859
(Springer, Berlin, Heidelberg, 2013)
3. H. Fujiwara, Spectroscopic Ellipsometry Principles and Applications (2007)
4. E. Collett, Field Guide to Polarization (SPIE, 2005)
5. S. Baskal, S. Baskal, in Physics of the Lorentz Group (IOP Publishing, 2015)
6. A. Derkachova, K. Kolwas, I. Demchenko, Plasmonics 11, 941 (2016)
7. S. Liu, W. Du, X. Chen, H. Jiang, C. Zhang, Opt. Express 23, 17316 (2015)
8. R.M.A. Azzam, Opt. Eng. 30, 1583 (1991)
9. S. Y. Lu, R. A. Chipman, Opt. Commun. (1998)
10. T.W.H. Oates, M. Ranjan, S. Facsko, H. Arwin, Opt. Express 19, 2014 (2011)
11. H. G. Tompkins, E. A. Irene, Handbook of Ellipsometry (2005)
12. A. F. J. Levi, A. F. J. Levi, in Essential Classical Mechanics for Device Physics (IOP Publishing,
2016)
13. D.E. Aspnes, A.A. Studna, Appl. Opt. 14, 220 (1975)
14. R.H. Muller, J.C. Farmer, Rev. Sci. Instrum. 55, 371 (1984)
15. H. G. Tompkins, A User’s Guide to Ellipsometry (Elsevier, 1993)
16. R. Gupta, M.J. Dyer, W.A. Weimer, J. Appl. Phys. 92, 5264 (2002)
17. M. Schubert, Phys. Rev. B Condens. Matter Mater. Phys. 53, 4265 (1996)
18. G.E. Jellison, Thin Solid Films 234, 416 (1993)
19. F. Wooten, Am. J. Phys. 70, 1269 (2002)
20. T.E. Tiwald, D.W. Thompson, J.A. Woollam, W. Paulson, R. Hance, Thin Solid Films 313–314,
661 (1998)
21. D.Y. Smith, M. Inokuti, W. Karstens, J. Phys. Condens. Matter 13, 3883 (2001)
22. G.E. Jellison, F.A. Modine, Appl. Phys. Lett. 69, 371 (1996)
23. A.S. Ferlauto, G.M. Ferreira, J.M. Pearce, C.R. Wronski, R.W. Collins, X. Deng, G. Ganguly,
J. Appl. Phys. 92, 2424 (2002)
24. T. C. Choy, Effective Medium Theory (Oxford University Press, 2015)
25. W. S. Wieglhofer, A. Lakhtakia (eds), Introduction to Complex Mediums for Optics and
Electromagnetics (SPIE, Bellingham, WA, USA, 2003)
26. S.A. Maier, Plasmonics: Fundamentals and Applications (Springer US, New York, NY, 2007)
27. F.J. García-Vidal, J.B. Pendry, Phys. Rev. Lett. 77, 1163 (1996)
28. A. Agrawal, I. Kriegel, D.J. Milliron, J. Phys. Chem. C 119, 6227 (2015)
29. J. Katyal, R.K. Soni, J. Mod. Opt. 60, 1717 (2013)
30. M. Ranjan, S. Facsko, M. Fritzsche, S. Mukherjee, Microelectron. Eng. 102, 44 (2013)
31. M. Ranjan, T.W.H. Oates, S. Facsko, W. Mller, Opt. Lett. 35, 2576 (2010)
32. S.A. Maier, H.A. Atwater, J. Appl. Phys. 98, 011101 (2005)