Contents
xv
Other Spectroscopic Techniques for Characterization of Optical,
Electrical and Mechanical Properties of Molecules
Impedance Spectroscopy . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 515
Neelam Yadav and Ravindra Dhar
Ellipsometry Techniques and Its Advanced Applications
in Plasmonics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 541
Mahesh Saini, Sebin Augustine, K. P. Sooraj, and Mukesh Ranjan
Atomic Force Microscopy-Based Force Spectroscopy and Its
Various Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 585
Jyoti Jaisawal, Amit Kumar Srivastav, Dheeraj K. Singh, and Umesh Kumar
Surface Photo-Voltage Spectroscopy: A Versatile Technique
to Probe Semiconductor Materials and Devices . . . . . . . . . . . . . . . . . . . . . . . 605
Akshay Jariwala, Aditi Toshniwal, and Vipul Kheraj
Optical Imaging in Biology: Basics and Applications . . . . . . . . . . . . . . . . . . 637
S. P. Singh and Soumik Siddhanta