13.3.4
The typical precursor gas for depositing the Si films is silane (SiH 4 ), often diluted
with hydrogen (H 2 ). The precursor gases are brought into the process chamber at low
pressure. In plasma-enhanced chemical vapour deposition (PECVD), a radio frequency
(RF) or very high frequency (VHF) bias voltage between two electrodes is used to
generate a plasma, which leads to dissociation of the SiH 4 atoms into radicals such as
SiH 3 , SiH 2 or SiH. These radicals react with the substrate, where a layer is growing. By
increasing the H 2 content, the material becomes more nanocrystalline, as sketched in
Figure 13.13.
As precursors for the doping, diborane (B 2 H 6 ) is mainly used for the p layers and
phosphine (PH 3 ) for the n layers. For silicon carbide layers, in addition to the silane,
methane (CH 4 ) is used. Silicon oxide layers can be made by combining silane with carbon
dioxide (CO 2 ).
After the p-i-n junction is deposited, the sample is covered with a mask, which
defines the areas onto which the metallic back contacts are to be deposited. In Delft, silver
is deposited with evaporation. Little pieces of silver are put in a boat that is heated by a
very high current flowing through it. The silver melts and evaporated silver particles can
move freely through a vacuum until they hit the sample, where a silver layer is deposited.
This process is explained in more detail in Chapter 14.
Now the solar cells are ready – every metallic square defines a little solar cell. The
small metal strip is the front contact and the back of the metallic square is the electric back
contact. Naturally, such a configuration is not suitable for large-scale thin-film PV
modules. The production of thin-film modules is discussed in Chapter 15.
Crystalline silicon thin-film solar cells
We conclude the section on thin-film silicon technology with a brief discussion on
crystalline silicon thin-film solar cells. The aim is to combine the advantages of crystalline
silicon technology and thin-film silicon technology [74] by using high-quality crystalline
films of only several tenths of micrometres thickness as absorbers. These films are
positioned on a substrate or a superstrate.
Different approaches are investigated for reaching this goal: Kerf-less wafering
techniques are investigated where thin wafers can be prepared without any kerf loss. The
wafers are then transferred onto a glass substrate. With this technique, efficiencies of
10.0% were obtained with a 50 μm thick absorber [74].
Alternatively, films of large grain nanocrystalline silicon or amorphous silicon can be
deposited. The amorphous films can be crystallized after deposition. This crystallization
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