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214. “Thickness effect on the extended-X-ray-absorption-fine-structure amplitude”, Stern, E. A.;
Kim, K. Phys. Rev. B, 1981, 23, 3781–3787
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R.; Dubois, J. M. J. Physique, 1982, 43, 539–548
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Structure Spectroscopy”, Fujii, G.; Ukibe, M.; Shiki, S.; Ohkubo, M. J. Low Temp. Phys.,
2014, 176, 255–260
202. “A practical superconducting-microcalorimeter X-ray spectrometer for beamline and laboratory science”, Doriese, W. B.; Abbamonte, P.; Alpert, B. K.; Bennett, D. A.; Denison, E. V.;
Fang, Y.; Fischer, D. A.; Fitzgerald, C. P.; Fowler, J. W.; Gard, J. D.; Hays-Wehle, J. P.;
Hilton, G. C.; Jaye, C.; McChesney, J. L.; Miaja-Avila, L.; Morgan, K. M.; Joe, Y. I.; O’Neil,
G. C.; Reintsema, C. D.; Rodolakis, F.; Schmidt, D. R.; Tatsuno, H.; Uhlig, J.; Vale, L. R.;
Ullom, J. N.; Swetz, D. S. Rev. Sci. Instrum., 2017, 88, 23
203. “Review of superconducting transition-edge sensors for X-ray and gamma-ray spectroscopy”,
Ullom, J. N.; Bennett, D. A. Supercon. Sci. Tech., 2015, 28, 084003
204. “Development of Low-Temperature Detectors For Generation-X and Other Missions Requiring High-Resolution, Large-Format, X-ray Detector Array”, Bandler, S. EOS White Paper,
2009
205. “Transition-Edge Sensors”, Irwin, K. D.; Hilton, G. C., in Cryogenic Particle Detection; Enss,
C., Ed.; Springer Berlin Heidelberg: Berlin, Heidelberg, 2005, pp. 63–150
206. Knoll, G. F. Radiation Detection and Measurement; John Wiley & Sons, Inc.: New York,
1999
207. “Digital pulse processing for NaI(T1) detectors”, Di Fulvio, A.; Shin, T. H.; Hamel, M. C.;
Pozzi, S. A. Nucl. Inst. Meth. A, 2016, 806, 169–174
208. “Fluorescence Detection of EXAFS: Sensitivity Enhancement for Dilute Species and Thin
Films”, Jaklevic, J.; Kirby, J. A.; Klein, M. P.; Robertson, A. S.; Brown, G. S.; Eisenberger,
P. Sol. State Comm., 1977, 23, 679–682
209. “Fluorescence Yield Detection - Why It Does Not Measure the X-Ray Absorption Cross
Section”, de Groot, F. M. F.; Arrio, M.-A.; Sainctavit, P.; Cartier, C.; Chen, C. T. Sol. State
Comm., 1994, 92, 991–995
210. “Total 3 s Emission Yield as Bulk-Sensitive Probe for a True Soft X-ray Absorption Spectrum?”, Miedema, P. S.; Beye, M. J. Phys. Chem. Lett., 2018, 9, 2579–2583
211. Carpenter, M., Ph. D., University of California—Davis, 2015
212. Stöhr, J. NEXAFS Spectroscopy; Springer-Verlag: New York, 2003
213. “Extended X-ray absorption fine structure—its strengths and limitations as a structural tool”,
Lee, P. A.; Citrin, P. H.; Eisenberger, P.; Kincaid, B. M. Rev. Mod. Phys., 1981, 53, 769–806
214. “Thickness effect on the extended-X-ray-absorption-fine-structure amplitude”, Stern, E. A.;
Kim, K. Phys. Rev. B, 1981, 23, 3781–3787
215. “Design of an EXAFS Experiment”, Heald, S. M., in X-Ray Absorption; Koningsberger, D. C.
and Prins, R., Ed.; John Wiley: New York, 1988, pp. 87–118
216. “On Experimental Attentuation Factors of the Amplitude of EXAFS Oscillations in Absorption, Reflectivity, and Luminescence Measurements”, Goulon, J.; Goulon-Ginet, C.; Cortes,
R.; Dubois, J. M. J. Physique, 1982, 43, 539–548
217. “Minimizing Glitches in XAFS Data - A Model for Glitch Formation”, Bridges, F.; Wang, X.;
Boyce, J. B. Nucl. Inst. Meth. A, 1991, 307, 316–324
218. “Brief Introduction of X-Ray Multiple Diffraction”, Chuan-Zheng, Y.; Jian-Min, H.; GuangWen, P. Rigaku J., 2000, 17
219. “Rotation of X-ray polarization in the glitches of a silicon crystal monochromator”, Sutter,
J. P.; Boada, R.; Bowron, D. T.; Stepanov, S. A.; Diaz-Moreno, S. J. App. Cryst., 2016, 49,
1209–1222
220. “Umweg—A Computer-Program for Calculation and Graphical Representation of
Umweganregung-Patterns”, Rossmanith, E. Zeit. Kristall., 1985, 171, 253–254
221. “Synchrotron Radiation Studies of K-Edge Photoabsorption Spectra of Kr, Br 2 , And GeCl 4 —
Comparison of Theory and Experiment”, Kincaid, B. M.; Eisenberger, P. Phys. Rev. Lett.,
1975, 34, 1361–1364
References
363