Fig. 10 TEM-BF images (a,d) and 2D GIXD patterns recorded with the incident q vector q i
oriented parallel (b, e) and perpendicular (c, f) to the P3HT chain direction c P3HT for oriented
P3HT films (20–50 nm thick) grown by slow-DEC: M w ¼ 7.9 kDa (a, b, c) and M w ¼ 50 kDa (d, e, f).
The insets show the scattering GIXD configurations and the orientation of the incident beam with
respect to the P3HT chain direction (c P3HT )
Understanding the Structure and Crystallization of Regioregular. . .
99
oriented parallel (b, e) and perpendicular (c, f) to the P3HT chain direction c P3HT for oriented
P3HT films (20–50 nm thick) grown by slow-DEC: M w ¼ 7.9 kDa (a, b, c) and M w ¼ 50 kDa (d, e, f).
The insets show the scattering GIXD configurations and the orientation of the incident beam with
respect to the P3HT chain direction (c P3HT )
Understanding the Structure and Crystallization of Regioregular. . .
99