9 Magnetism of Individual Nanoparticles Probed by X-Ray …
237
terization using XPEEM is not restricted to ferromagnetic nanoparticles, but can also
be used for the investigation of antiferromagnetic nanoparticles by means of the x-ray
magnetic linear dichroism effect. Similar to the case of ferromagnetic nanoparticles,
XPEEM can help to reveal finite size effects in nano-sized antiferromagnets, which
are not only interesting for fundamental research on magnetism at the nanoscale, but
also of great interest for spintronics applications [68].
Acknowledgements The author thanks J. Bansmann, A. Fraile Rodríguez, K.-H. Meiwes-Broer,
and F. Nolting for their contributions and their support in establishing XPEEM as an in situ probe
for studying individual nanoparticles. C. A. F. Vaz is acknowledged for his contribution to the
experiments, fruitful discussions, and critical reading of this manuscript.
References
1. A.H. Lu, E.L. Salabas, F. Schüth, Angew. Chem. 46, 1222 (2007)
2. D.L. Huber, Small 1, 482 (2005)
3. J.L. Dormann, D. Fiorani, E. Tronc, Magnetic Relaxation in Fine-Particle Systems (Wiley, New
York, 1997)
4. R.H. Kodama, J. Magn. Magn. Mater. 200, 359 (1999)
5. A. Kleibert, A. Balan, R. Yanes, P.M. Derlet, C.A.F. Vaz, M. Timm, A. Fraile Rodríguez,
A. Béché, J. Verbeeck, R.S. Dhaka, M. Radovic, U. Nowak, F. Nolting, Phys. Rev. B 95,
195404 (2017)
6. D. Schmool, H. Kachkachi, Solid State Phys. 66, 301 (2015)
7. M. Jamet, W. Wernsdorfer, C. Thirion, D. Mailly, V. Dupuis, P. Mélinon, A. Pérez, Phys. Rev.
Lett. 86, 4676 (2001)
8. C. Gatel, F.J. Bonilla, A. Meffre, E. Snoeck, B. Warot-Fonro, B. Chaudret, L.M. Lacroix, T.
Blon, Nano Lett. 15, 6952 (2015)
9. E. Bauer, Surface Microscopy with Low Energy Electrons (Springer, New York, 2014)
10. C.A.F. Vaz, A. Kleibert, M. El Kazzi, in Nanoscale XPEEM Spectromicroscopy 21st Century
Nanoscience–A Handbook: Advanced Analytical Methods and Intrumentation, Vol. 3, ed. by
D.S. Klaus (CRC Press, Taylor & Francis Group, Boca Raton, London, New York, 2020)
11. C.M. Schneider, J. Magn. Magn. Mater. 160, 9517 (1997)
12. G. Schönhense, J. Phys.: Condens. Matter 11, 9517 (1999)
13. A. Scholl, Curr. Opin. Solid State Mater. Sci. 7, 59 (2003)
14. J. Stöhr, H.C. Siegmann, Magnetism (Springer, Berlin, 2006)
15. E. Beaurepaire, H. Bulou, F. Scheurer, J.P. Kappler (eds.), Magnetism: A Synchrotron Radiation
Approach. Lect. Notes Phys. 697 (Springer, Berlin Heidelberg, 2006)
16. A. Locatelli, E. Bauer, J. Phys.: Condens. Matter 20, 093002 (2008)
17. F. Nolting, in Magnetism and Synchrotron Radiation, ed. by E. Beaurepaire, H. Bulou,
F. Scheurer, K. Jean-Paul (Springer, Berlin, 2010), pp. 345–366
18. W. Kuch, R. Schäfer, P. Fischer, F.U. Hillebrecht, Magnetic Microscopy of Layered Structures.
Springer Series in Surface Sciences 57 (Springer, Berlin, Heidelberg, 2015)
19. J. Rockenberger, F. Nolting, J. Lüning, J. Hu, A.P. Alivisatos, J. Chem. Phys. 116, 6322 (2002)
20. A. Fraile Rodríguez, F. Nolting, J. Bansmann, A. Kleibert, L.J. Heyderman, J. Magn. Magn.
Mater. 316, 426 (2007)
21. A. Fraile Rodríguez, A. Kleibert, J. Bansmann, A. Voitkans, L.J. Heyderman, F. Nolting, Phys.
Rev. Lett. 104, 127201 (2010)
22. A. Fraile Rodríguez, A. Kleibert, J. Bansmann, F. Nolting, J. Phys. D 43, 474006 (2010)
23. S. Gangopadhyay, G.C. Hadjipanayis, B. Dale, C.M. Sorensen, K.J. Klabunde, V.
Papaefthymiou, A. Kostikas, Phys. Rev. B 45, 9778 (1992)
237
terization using XPEEM is not restricted to ferromagnetic nanoparticles, but can also
be used for the investigation of antiferromagnetic nanoparticles by means of the x-ray
magnetic linear dichroism effect. Similar to the case of ferromagnetic nanoparticles,
XPEEM can help to reveal finite size effects in nano-sized antiferromagnets, which
are not only interesting for fundamental research on magnetism at the nanoscale, but
also of great interest for spintronics applications [68].
Acknowledgements The author thanks J. Bansmann, A. Fraile Rodríguez, K.-H. Meiwes-Broer,
and F. Nolting for their contributions and their support in establishing XPEEM as an in situ probe
for studying individual nanoparticles. C. A. F. Vaz is acknowledged for his contribution to the
experiments, fruitful discussions, and critical reading of this manuscript.
References
1. A.H. Lu, E.L. Salabas, F. Schüth, Angew. Chem. 46, 1222 (2007)
2. D.L. Huber, Small 1, 482 (2005)
3. J.L. Dormann, D. Fiorani, E. Tronc, Magnetic Relaxation in Fine-Particle Systems (Wiley, New
York, 1997)
4. R.H. Kodama, J. Magn. Magn. Mater. 200, 359 (1999)
5. A. Kleibert, A. Balan, R. Yanes, P.M. Derlet, C.A.F. Vaz, M. Timm, A. Fraile Rodríguez,
A. Béché, J. Verbeeck, R.S. Dhaka, M. Radovic, U. Nowak, F. Nolting, Phys. Rev. B 95,
195404 (2017)
6. D. Schmool, H. Kachkachi, Solid State Phys. 66, 301 (2015)
7. M. Jamet, W. Wernsdorfer, C. Thirion, D. Mailly, V. Dupuis, P. Mélinon, A. Pérez, Phys. Rev.
Lett. 86, 4676 (2001)
8. C. Gatel, F.J. Bonilla, A. Meffre, E. Snoeck, B. Warot-Fonro, B. Chaudret, L.M. Lacroix, T.
Blon, Nano Lett. 15, 6952 (2015)
9. E. Bauer, Surface Microscopy with Low Energy Electrons (Springer, New York, 2014)
10. C.A.F. Vaz, A. Kleibert, M. El Kazzi, in Nanoscale XPEEM Spectromicroscopy 21st Century
Nanoscience–A Handbook: Advanced Analytical Methods and Intrumentation, Vol. 3, ed. by
D.S. Klaus (CRC Press, Taylor & Francis Group, Boca Raton, London, New York, 2020)
11. C.M. Schneider, J. Magn. Magn. Mater. 160, 9517 (1997)
12. G. Schönhense, J. Phys.: Condens. Matter 11, 9517 (1999)
13. A. Scholl, Curr. Opin. Solid State Mater. Sci. 7, 59 (2003)
14. J. Stöhr, H.C. Siegmann, Magnetism (Springer, Berlin, 2006)
15. E. Beaurepaire, H. Bulou, F. Scheurer, J.P. Kappler (eds.), Magnetism: A Synchrotron Radiation
Approach. Lect. Notes Phys. 697 (Springer, Berlin Heidelberg, 2006)
16. A. Locatelli, E. Bauer, J. Phys.: Condens. Matter 20, 093002 (2008)
17. F. Nolting, in Magnetism and Synchrotron Radiation, ed. by E. Beaurepaire, H. Bulou,
F. Scheurer, K. Jean-Paul (Springer, Berlin, 2010), pp. 345–366
18. W. Kuch, R. Schäfer, P. Fischer, F.U. Hillebrecht, Magnetic Microscopy of Layered Structures.
Springer Series in Surface Sciences 57 (Springer, Berlin, Heidelberg, 2015)
19. J. Rockenberger, F. Nolting, J. Lüning, J. Hu, A.P. Alivisatos, J. Chem. Phys. 116, 6322 (2002)
20. A. Fraile Rodríguez, F. Nolting, J. Bansmann, A. Kleibert, L.J. Heyderman, J. Magn. Magn.
Mater. 316, 426 (2007)
21. A. Fraile Rodríguez, A. Kleibert, J. Bansmann, A. Voitkans, L.J. Heyderman, F. Nolting, Phys.
Rev. Lett. 104, 127201 (2010)
22. A. Fraile Rodríguez, A. Kleibert, J. Bansmann, F. Nolting, J. Phys. D 43, 474006 (2010)
23. S. Gangopadhyay, G.C. Hadjipanayis, B. Dale, C.M. Sorensen, K.J. Klabunde, V.
Papaefthymiou, A. Kostikas, Phys. Rev. B 45, 9778 (1992)