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M. Hiramoto
Fig. 9.5 (a) (b) Structures of invertible two-layered H 2 Pc/C 60 cells with heavily doped
organic/metal interfaces. For the cells in (a) and (b), photogenerated holes and electrons are extracted
to ITO and Ag, and to Ag and ITO, respectively. The total thicknesses of the H 2 Pc and C 60 films are
kept the same. (c) (d) Current–voltage (J-V) characteristics for cells (a) and (b) (red curves). The
blue curves are for the cells without heavily doped interfaces. The photocurrent and the dark current
are shown by solid and broken curves, respectively. The ITO electrode was irradiated with simulated
solar light (AM1.5, 100 mWcm −2 ). Cell performances: (a) J sc : 3.38 mAcm −2 , V oc : 0.46 V, FF:
0.59, Efficiency: 0.91%. (b) J sc : 2.70 mAcm −2 , V oc : 0.43 V, FF: 0.49, Efficiency: 0.57%. (e) Energy
structure for an ITO/n + -C 60 contact measured by Kelvin band-mapping. A tunneling junction for
photogenerated electrons is formed. Reproduced with permission from [55]. Copyright 2012 The
Japan Society of Applied Physics
M. Hiramoto
Fig. 9.5 (a) (b) Structures of invertible two-layered H 2 Pc/C 60 cells with heavily doped
organic/metal interfaces. For the cells in (a) and (b), photogenerated holes and electrons are extracted
to ITO and Ag, and to Ag and ITO, respectively. The total thicknesses of the H 2 Pc and C 60 films are
kept the same. (c) (d) Current–voltage (J-V) characteristics for cells (a) and (b) (red curves). The
blue curves are for the cells without heavily doped interfaces. The photocurrent and the dark current
are shown by solid and broken curves, respectively. The ITO electrode was irradiated with simulated
solar light (AM1.5, 100 mWcm −2 ). Cell performances: (a) J sc : 3.38 mAcm −2 , V oc : 0.46 V, FF:
0.59, Efficiency: 0.91%. (b) J sc : 2.70 mAcm −2 , V oc : 0.43 V, FF: 0.49, Efficiency: 0.57%. (e) Energy
structure for an ITO/n + -C 60 contact measured by Kelvin band-mapping. A tunneling junction for
photogenerated electrons is formed. Reproduced with permission from [55]. Copyright 2012 The
Japan Society of Applied Physics
