310 Index
thermal fluctuation 166, 168
thermal instability 16, 17, 132, 135, 152
thermal ionization 69
thermodiffusion 47
thermophoresis 47
thin plasmas 69
Thomson equation 31, 124, 129, 131
threshold voltage 218
time response 224
top-down 2
transmission electron microscopy 292
transversal modes 198, 199
true stress–strain diagram 250
two-dimensional 7
two-dimensional nanocomposite 11
two-zone model 160
u
unit cell volume 30
v
van der Waals bond 111
van der Waals force 84, 99
van-der-Waals 280
vapor pressure 30, 32
Verdet constant 225, 226
vibrations 88
viscosity 115, 116
volume dilation 31
w
wavelength-dispersive system 295
white soot 7
wide-gap semiconductor 239
work function 216
x
X-ray diffraction 285
X-ray fluorescence 284
X-ray photon 293
X-rays 282–284, 292, 294
y
yield stress 249, 251, 253, 255
Young’s modulus 250, 252–254, 269,
271–276
z
zero-dimensional 7
zero-dimensional particle 11
~StormRG~
thermal fluctuation 166, 168
thermal instability 16, 17, 132, 135, 152
thermal ionization 69
thermodiffusion 47
thermophoresis 47
thin plasmas 69
Thomson equation 31, 124, 129, 131
threshold voltage 218
time response 224
top-down 2
transmission electron microscopy 292
transversal modes 198, 199
true stress–strain diagram 250
two-dimensional 7
two-dimensional nanocomposite 11
two-zone model 160
u
unit cell volume 30
v
van der Waals bond 111
van der Waals force 84, 99
van-der-Waals 280
vapor pressure 30, 32
Verdet constant 225, 226
vibrations 88
viscosity 115, 116
volume dilation 31
w
wavelength-dispersive system 295
white soot 7
wide-gap semiconductor 239
work function 216
x
X-ray diffraction 285
X-ray fluorescence 284
X-ray photon 293
X-rays 282–284, 292, 294
y
yield stress 249, 251, 253, 255
Young’s modulus 250, 252–254, 269,
271–276
z
zero-dimensional 7
zero-dimensional particle 11
~StormRG~
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