New Effective Filter in the Spatial
Domain for Speckle Noise Reduction
Yu. Kotsiuba, V. M. Fitio, H. Petrovska, and Ya. V. Bobitski
1 Introduction
Digital holography (DH) is an effective and robust method that is used in metrology
to study deformation fields, retrieve surface topography, and visualize phase images
[1, 2]. In the DH method, the difference in the optical path length between the reference beam and the object beam is measured. The object beam can pass through
transparent samples (transmission configuration) or being reflected by opaque
surfaces (reflection configuration). After digital reconstruction, one can calculate
the corresponding phase field of the object.
Digital holographic interferometry (DHI), in particular, the method of two exposures, is one of the submethods of digital holography (DH) which is commonly
used in metrology. In this method, two reconstructed phase fields of the same object
recorded at different moments of time are compared. Thus, a phase difference map
containing 2π discontinuities is obtained as a result of the direct phase subtraction.
After that, the phase unwrapping is carried out to obtain a quantitative representation
of the measured value (displacement field, deformation field, vibration field, etc.).
A significant drawback of the DHI is speckle decorrelation. It occurs when
comparing phase fields obtained from two different digital holograms and leads to the
Yu. Kotsiuba
Karpenko Physico-Mechanical Institute of the NAS of Ukraine, Naukova Str. 5, 79000 Lviv,
Ukraine
V. M. Fitio · H. Petrovska (B) · Ya. V. Bobitski
Department of Photonics, Lviv Polytechnic National University, S. Bandera Str. 12, 79013 Lviv,
Ukraine
e-mail: halyna.a.petrovska@lpnu.ua
Ya. V. Bobitski
Faculty of Mathematics and Natural Sciences, University of Rzeszow, Pigonia Str.1, 35959
Rzeszow, Poland
© Springer Nature Switzerland AG 2021
O. Fesenko and L. Yatsenko (eds.), Nanomaterials and Nanocomposites,
Nanostructure Surfaces, and Their Applications, Springer Proceedings
in Physics 246, https://doi.org/10.1007/978-3-030-51905-6_14
179
Domain for Speckle Noise Reduction
Yu. Kotsiuba, V. M. Fitio, H. Petrovska, and Ya. V. Bobitski
1 Introduction
Digital holography (DH) is an effective and robust method that is used in metrology
to study deformation fields, retrieve surface topography, and visualize phase images
[1, 2]. In the DH method, the difference in the optical path length between the reference beam and the object beam is measured. The object beam can pass through
transparent samples (transmission configuration) or being reflected by opaque
surfaces (reflection configuration). After digital reconstruction, one can calculate
the corresponding phase field of the object.
Digital holographic interferometry (DHI), in particular, the method of two exposures, is one of the submethods of digital holography (DH) which is commonly
used in metrology. In this method, two reconstructed phase fields of the same object
recorded at different moments of time are compared. Thus, a phase difference map
containing 2π discontinuities is obtained as a result of the direct phase subtraction.
After that, the phase unwrapping is carried out to obtain a quantitative representation
of the measured value (displacement field, deformation field, vibration field, etc.).
A significant drawback of the DHI is speckle decorrelation. It occurs when
comparing phase fields obtained from two different digital holograms and leads to the
Yu. Kotsiuba
Karpenko Physico-Mechanical Institute of the NAS of Ukraine, Naukova Str. 5, 79000 Lviv,
Ukraine
V. M. Fitio · H. Petrovska (B) · Ya. V. Bobitski
Department of Photonics, Lviv Polytechnic National University, S. Bandera Str. 12, 79013 Lviv,
Ukraine
e-mail: halyna.a.petrovska@lpnu.ua
Ya. V. Bobitski
Faculty of Mathematics and Natural Sciences, University of Rzeszow, Pigonia Str.1, 35959
Rzeszow, Poland
© Springer Nature Switzerland AG 2021
O. Fesenko and L. Yatsenko (eds.), Nanomaterials and Nanocomposites,
Nanostructure Surfaces, and Their Applications, Springer Proceedings
in Physics 246, https://doi.org/10.1007/978-3-030-51905-6_14
179