Springer Series in Measurement Science and
Technology
Series Editors
Markys G. Cain Electrosciences Ltd. Farnham, Surrey, UK
Giovanni Battista Rossi DIMEC Laboratorio di Misure Università degli Studi di
Genova Genova, Italy
Jirí Tesař Czech Metrology Institute Prague, Czech Republic
Marijn van Veghel VSL Dutch Metrology Institute Delft, Zuid-Holland,
The Netherlands
Kyung-Young Jhang School of Mechanical Engineering Hanyang University
Seoul, Korea (Republic of)
Technology
Series Editors
Markys G. Cain Electrosciences Ltd. Farnham, Surrey, UK
Giovanni Battista Rossi DIMEC Laboratorio di Misure Università degli Studi di
Genova Genova, Italy
Jirí Tesař Czech Metrology Institute Prague, Czech Republic
Marijn van Veghel VSL Dutch Metrology Institute Delft, Zuid-Holland,
The Netherlands
Kyung-Young Jhang School of Mechanical Engineering Hanyang University
Seoul, Korea (Republic of)
