358
12 Heterostructures
Fig. 12.9 a Plan-view
TEM image (inset: electron
diffraction diagram
averaged over several
grains) of ZnO on Si(111).
b Cross-sectional TEM of
the same sample. c
High-resolution
cross-sectional image of
the ZnO/SiO 2 /Si interface
region. Adapted
from [1138]
(a)
(b)
Si
ZnO
(c)
SiO x
Si
ZnO
Fig. 12.10 Visualization
of the minimum number of
rotational domains for
different substrate and
epilayer symmetries
according to Table 12.2
sub
epi
2
3
4
6
2
3
4
6