The Integrative Technology of Testability
Design and Fault Diagnosis for Complex
Electronic Information System
Leqing Ou and Fang Bai
(&)
The 28th Research Institute of China Electronics Technology Group Corporation,
Nanjing 210007, China
baifang@nuaa.edu.cn
Abstract. Complex electronic system has complicated principal and excess
amount of single equipment and malfunctions, which makes it difficult to run
quick failure diagnosis and thus security was low. On the basis of directed graph
model and correlation model, this paper explores the integrative technology of
testability design and failure diagnosis for complex electronic information
systems. Using vehicle electronic information system as an example establishes
functional directed graph fault model and analyzes its testability, which provides
reference for quick fault diagnosis.
Keywords: Complex electronic information system Á Testability design Á Fault
diagnosis
1 Introduction
Testability model is mainly used in describing the logical relationship between system
failure and testability and the occupancy of test resources. It provides effective design
and evaluation for testability design. The testability model of the system is different
from the system model. The system model is mainly used to describe the structure,
behavior and function information of the system. Testability model is often seen
equivalent to fault model. Fault model is a standard abstract expression of fault
information, and it is a series of definitions for describing system diagnosis knowledge
and functional characteristics [1–4].
There are two main types of testability models: one is structured model. Similar to
the system schematic diagram, the structural model represents the structure/function
connection relationship and the direction of transmission in the form of directional
diagram, while the corresponding relationship between the node of the structural model
and the actual system module is represented by the directed graph. Testability analysis
based on structural model is simple, fast and convenient for the testing and analysis of
large-scaled systems. However, structure is not equivalent to function, especially for
the complex function dependency embedded into simple block diagram. Thus, to
obtain the complete function dependency, structured model cannot be fully satisfied
[5, 6].
© Springer Nature Singapore Pte Ltd. 2020
Q. Liang et al. (Eds.): Artificial Intelligence in China, LNEE 572, pp. 391–397, 2020.
https://doi.org/10.1007/978-981-15-0187-6_46
Design and Fault Diagnosis for Complex
Electronic Information System
Leqing Ou and Fang Bai
(&)
The 28th Research Institute of China Electronics Technology Group Corporation,
Nanjing 210007, China
baifang@nuaa.edu.cn
Abstract. Complex electronic system has complicated principal and excess
amount of single equipment and malfunctions, which makes it difficult to run
quick failure diagnosis and thus security was low. On the basis of directed graph
model and correlation model, this paper explores the integrative technology of
testability design and failure diagnosis for complex electronic information
systems. Using vehicle electronic information system as an example establishes
functional directed graph fault model and analyzes its testability, which provides
reference for quick fault diagnosis.
Keywords: Complex electronic information system Á Testability design Á Fault
diagnosis
1 Introduction
Testability model is mainly used in describing the logical relationship between system
failure and testability and the occupancy of test resources. It provides effective design
and evaluation for testability design. The testability model of the system is different
from the system model. The system model is mainly used to describe the structure,
behavior and function information of the system. Testability model is often seen
equivalent to fault model. Fault model is a standard abstract expression of fault
information, and it is a series of definitions for describing system diagnosis knowledge
and functional characteristics [1–4].
There are two main types of testability models: one is structured model. Similar to
the system schematic diagram, the structural model represents the structure/function
connection relationship and the direction of transmission in the form of directional
diagram, while the corresponding relationship between the node of the structural model
and the actual system module is represented by the directed graph. Testability analysis
based on structural model is simple, fast and convenient for the testing and analysis of
large-scaled systems. However, structure is not equivalent to function, especially for
the complex function dependency embedded into simple block diagram. Thus, to
obtain the complete function dependency, structured model cannot be fully satisfied
[5, 6].
© Springer Nature Singapore Pte Ltd. 2020
Q. Liang et al. (Eds.): Artificial Intelligence in China, LNEE 572, pp. 391–397, 2020.
https://doi.org/10.1007/978-981-15-0187-6_46