Topics in Applied Physics
Volume 136
Series Editors
Young Pak Lee, Physics, Hanyang University, Seoul, Korea (Republic of)
Paolo M. Ossi, NEMAS - WIBIDI Lab, Politecnico di Milano, Milano, Italy
David J. Lockwood, Metrology Research Center, National Research Council
of Canada, Ottawa, ON, Canada
Kaoru Yamanouchi, Department of Chemistry, The University of Tokyo, Tokyo,
Japan