Index
357
Polystyrene beads, 264
Poly(vinyl chloride-co-vinyl acetate), 290
Polyvinylidene fluoride, 337
Polyvinylpyrrolidone, 24, 39
Poly(vinylpyrrolidone) (PVP), 290
Polyyne, 42
Porosity, 310
Porous anodes, 307
Porous glass, 250
Porous structures, 310
Porphyrins, 54
Post-annealing, 250
Post-Moore’s law, 63
Post-mortem, 337
Pouch cell design, 315
Power, 10
Power losses, 314
Poynting vector, 45
P-polarization, 116, 122
Practical capacity, 323
Precising machining, 1
Precision machining, 2
Pre-programmed digital patterns, 275
Printed electronics, 25, 62
Printing mechanism, 273
Printing process, 310
Processing efficiency, 77
Proliferation, 297
Propagation constant, 18
Propagation length, 22
Protective coating, 163
Pulsed laser ablation in liquids technique,
134
Pulsed laser beams, 134
Pulsed light, 28
Pulse duration, 77, 318
Pulse number, 318
Pulse period, 2
Pulse width, 165
Pulverization, 316
P-xylene, 291
Pyrometer, 333
Q
Q-factor, 257
Quantum mechanics, 12
Quantum tunneling, 4
Quasistatic approximation, 13, 14
Quasi-static polarizability, 115
Quasi-stationary character, 31
Quenching, 164
R
Radiation heat loss, 34
Radiation heat transfer, 122
Randles-Ševˇ cík equation, 328
Receiver substrate, 287
Reference-cell, 328
Refractive index, 185
Relaxation time, 324
Repetition rate, 336
Repitition rates, 119
Residual heat, 179
Residual stress, 42, 163
Resistance, 10
Resistivity, 28
Resolidification, 170
Resonant absorption, 6
Resonant tunneling diodes, 53
Reversible capacity, 336
Rhodamine 6G, 264
Robotic arms, 8
Rutile phases, 138
S
Sacrificial layer, 163
Salmon sperm DNA, 278
Scaffold, 267
Scaffold molecule, 57
Scaling behavior, 8
Scaling law, 6, 8
Scaling of nanomaterials, 1
Scanning force microscope, 114
Scanning Near-field Optical Microscope
(SNOM), 113
Scanning Probe Microscope (SPM), 113
Scanning tunneling microscope, 119
Scanning Electron Microscopy (SEM), 166,
323
Scanning near-field optical microscope, 60
Scanning speed, 123, 296
Scattering force, 45
Scattering light, 10
Self-organized, 333
Self-organized structuring, 313
Semiconductors, 2
Sensor, 277, 290
Separator materials, 315
SERS, 142–144, 146–148
Shadowgraphy, 137, 287
Shockwave, 42, 287
Shot peening, 167
Silicon, 315
Silicon channels, 296
357
Polystyrene beads, 264
Poly(vinyl chloride-co-vinyl acetate), 290
Polyvinylidene fluoride, 337
Polyvinylpyrrolidone, 24, 39
Poly(vinylpyrrolidone) (PVP), 290
Polyyne, 42
Porosity, 310
Porous anodes, 307
Porous glass, 250
Porous structures, 310
Porphyrins, 54
Post-annealing, 250
Post-Moore’s law, 63
Post-mortem, 337
Pouch cell design, 315
Power, 10
Power losses, 314
Poynting vector, 45
P-polarization, 116, 122
Practical capacity, 323
Precising machining, 1
Precision machining, 2
Pre-programmed digital patterns, 275
Printed electronics, 25, 62
Printing mechanism, 273
Printing process, 310
Processing efficiency, 77
Proliferation, 297
Propagation constant, 18
Propagation length, 22
Protective coating, 163
Pulsed laser ablation in liquids technique,
134
Pulsed laser beams, 134
Pulsed light, 28
Pulse duration, 77, 318
Pulse number, 318
Pulse period, 2
Pulse width, 165
Pulverization, 316
P-xylene, 291
Pyrometer, 333
Q
Q-factor, 257
Quantum mechanics, 12
Quantum tunneling, 4
Quasistatic approximation, 13, 14
Quasi-static polarizability, 115
Quasi-stationary character, 31
Quenching, 164
R
Radiation heat loss, 34
Radiation heat transfer, 122
Randles-Ševˇ cík equation, 328
Receiver substrate, 287
Reference-cell, 328
Refractive index, 185
Relaxation time, 324
Repetition rate, 336
Repitition rates, 119
Residual heat, 179
Residual stress, 42, 163
Resistance, 10
Resistivity, 28
Resolidification, 170
Resonant absorption, 6
Resonant tunneling diodes, 53
Reversible capacity, 336
Rhodamine 6G, 264
Robotic arms, 8
Rutile phases, 138
S
Sacrificial layer, 163
Salmon sperm DNA, 278
Scaffold, 267
Scaffold molecule, 57
Scaling behavior, 8
Scaling law, 6, 8
Scaling of nanomaterials, 1
Scanning force microscope, 114
Scanning Near-field Optical Microscope
(SNOM), 113
Scanning Probe Microscope (SPM), 113
Scanning tunneling microscope, 119
Scanning Electron Microscopy (SEM), 166,
323
Scanning near-field optical microscope, 60
Scanning speed, 123, 296
Scattering force, 45
Scattering light, 10
Self-organized, 333
Self-organized structuring, 313
Semiconductors, 2
Sensor, 277, 290
Separator materials, 315
SERS, 142–144, 146–148
Shadowgraphy, 137, 287
Shockwave, 42, 287
Shot peening, 167
Silicon, 315
Silicon channels, 296