2 Ultrafast Laser Enabling Versatile Fabrication of Surface …
101
Fig. 2.27 Microscopic characterization of the micro-nano structures as well as nanowires on the
ultrafast laser structured Cu surface. Reproduced from [61] with permission from the American
Chemical Society
Fig. 2.28 Enhanced IR antireflection via the oxide nanowires grown on ultrafast laser fabricated
SMNS. The black, red, and blue solid lines correspond to the measured hemispherical reflectance
for the polished Cu surface, the structured Cu surface without oxide nanowires, and the structured
Cu surface with oxide nanowires, respectively. Reproduced from [61] with permission from the
American Chemical Society
respectively. Given that the bulk Cu is opaque to the infrared light, this yields a 98%
absorbance, suggesting that a near-unity infrared antireflection property has been
realized.
101
Fig. 2.27 Microscopic characterization of the micro-nano structures as well as nanowires on the
ultrafast laser structured Cu surface. Reproduced from [61] with permission from the American
Chemical Society
Fig. 2.28 Enhanced IR antireflection via the oxide nanowires grown on ultrafast laser fabricated
SMNS. The black, red, and blue solid lines correspond to the measured hemispherical reflectance
for the polished Cu surface, the structured Cu surface without oxide nanowires, and the structured
Cu surface with oxide nanowires, respectively. Reproduced from [61] with permission from the
American Chemical Society
respectively. Given that the bulk Cu is opaque to the infrared light, this yields a 98%
absorbance, suggesting that a near-unity infrared antireflection property has been
realized.