Cover picture: A monatomically thick graphene layer, viewed in a Nion UltraSTEM200 aberration-corrected scanning transmission electron microscope (STEM) located at the Oak Ridge National Laboratory. The microscope was operated at 60 KV
in annular dark field (ADF) mode. The red regions represent individual carbon atoms with nearest-neighbor spacing of 0.14
nm. The red regions represent the highest scattered intensity, and the blue regions represent the lowest scattered intensity.
The image is a sum of intensities of 350 separate areas of a single graphene specimen, each having 128×128 pixels. Each
individual scan is translated so as to maximize the cross-correlation function between separate scans. This greatly reduces
noise in the composite image. The original image and specimen were prepared by Dr. Florence Nelson, and the correlation
analysis was performed by Jennifer Passage. Both are affiliated with the College of Nanoscale Science and Engineering,
SUNY Polytechnic Institute, Albany, NY.
The electron microscopy was guided by Dr. Juan-Carlos Idrobo at ORNL in the Shared Research Equipment (ShaRE) User
facility, sponsored by the Office of Basic Energy Sciences, U.S. Department of Energy.
CRC Press
Taylor & Francis Group
6000 Broken Sound Parkway NW, Suite 300
Boca Raton, FL 33487-2742
© 2015 by Taylor & Francis Group, LLC
CRC Press is an imprint of Taylor & Francis Group, an Informa business
No claim to original U.S. Government works
Printed on acid-free paper
Version Date: 20150323
International Standard Book Number-13: 978-1-4822-2994-3 (Hardback)
This book contains information obtained from authentic and highly regarded sources. Reasonable efforts have been made
to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all
materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all
material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not
been obtained. If any copyright material has not been acknowledged please write and let us know so we may rectify in any
future reprint.
The Open Access version of this book, available at www.taylorfrancis.com, has been made available under a Creative Commons
Attribution-Non Commercial-No Derivatives 4.0 license.
Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation without intent to infringe.
Library of Congress Cataloging‑in‑Publication Data
Groves, Timothy R.
Charged particle optics theory : an introduction / author, Timothy R. Groves.
pages cm -- (Optical sciences and applications of light)
Includes bibliographical references and index.
ISBN 978-1-4822-2994-3 (hardcover : alk. paper) 1. Particle beams. 2. Electron optics. 3. Beam
optics. I. Title.
QC793.3.B4G76 2015
539.7’3--dc23
2015001451
Visit the Taylor & Francis Web site at
http://www.taylorandfrancis.com
and the CRC Press Web site at
http://www.crcpress.com
in annular dark field (ADF) mode. The red regions represent individual carbon atoms with nearest-neighbor spacing of 0.14
nm. The red regions represent the highest scattered intensity, and the blue regions represent the lowest scattered intensity.
The image is a sum of intensities of 350 separate areas of a single graphene specimen, each having 128×128 pixels. Each
individual scan is translated so as to maximize the cross-correlation function between separate scans. This greatly reduces
noise in the composite image. The original image and specimen were prepared by Dr. Florence Nelson, and the correlation
analysis was performed by Jennifer Passage. Both are affiliated with the College of Nanoscale Science and Engineering,
SUNY Polytechnic Institute, Albany, NY.
The electron microscopy was guided by Dr. Juan-Carlos Idrobo at ORNL in the Shared Research Equipment (ShaRE) User
facility, sponsored by the Office of Basic Energy Sciences, U.S. Department of Energy.
CRC Press
Taylor & Francis Group
6000 Broken Sound Parkway NW, Suite 300
Boca Raton, FL 33487-2742
© 2015 by Taylor & Francis Group, LLC
CRC Press is an imprint of Taylor & Francis Group, an Informa business
No claim to original U.S. Government works
Printed on acid-free paper
Version Date: 20150323
International Standard Book Number-13: 978-1-4822-2994-3 (Hardback)
This book contains information obtained from authentic and highly regarded sources. Reasonable efforts have been made
to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all
materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all
material reproduced in this publication and apologize to copyright holders if permission to publish in this form has not
been obtained. If any copyright material has not been acknowledged please write and let us know so we may rectify in any
future reprint.
The Open Access version of this book, available at www.taylorfrancis.com, has been made available under a Creative Commons
Attribution-Non Commercial-No Derivatives 4.0 license.
Trademark Notice: Product or corporate names may be trademarks or registered trademarks, and are used only for identification and explanation without intent to infringe.
Library of Congress Cataloging‑in‑Publication Data
Groves, Timothy R.
Charged particle optics theory : an introduction / author, Timothy R. Groves.
pages cm -- (Optical sciences and applications of light)
Includes bibliographical references and index.
ISBN 978-1-4822-2994-3 (hardcover : alk. paper) 1. Particle beams. 2. Electron optics. 3. Beam
optics. I. Title.
QC793.3.B4G76 2015
539.7’3--dc23
2015001451
Visit the Taylor & Francis Web site at
http://www.taylorandfrancis.com
and the CRC Press Web site at
http://www.crcpress.com