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[36] Goodman J.W. 2004. Introduction to Fourier Optics, Third
edition, Roberts and Company Publishers, ISBN-13: 9780974707723.
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[35] Goldstein H., Poole C.P. and Safko J.L. 2001. Classical
Mechanics, Third edition, Addison–Wesley, ISBN-13: 9780201657029.
[36] Goodman J.W. 2004. Introduction to Fourier Optics, Third
edition, Roberts and Company Publishers, ISBN-13: 9780974707723.
[37] Gradshteyn I.S., Ryzhik I.M. and Jeffrey A. 1994. Table of
Integrals, Series, and Products, Fifth edition, Academic Press,
ISBN-13: 978-0122947551.
[38] Groves T.R. 1975. Thick specimens in the CEM and STEM,
resolution and image formation, Ultramicroscopy 1, 15.
[39] Groves T.R., Hammond D.L. and Kuo H.P. 1979. Electron beam broadening effects caused by discreteness of space
charge, J. Vacuum Sci. Technol. 16(6), 1680.
[40] Groves T.R. 1994. Efficiency enhancement of Monte Carlo
simulation of particle beam interaction by separation of
stochastic and continuum contributions, J. Vacuum Sci.
Technol. B, 12(6), 3483.
[41] Groves T.R. 1999. Theory of Coulomb scattering in particle
beams using Markov’s method, J. Vacuum Sci. Technol. B,
17(6), 2808.
[42] Hall C.E. 1966. Introduction to Electron Microscopy,
McGraw–Hill, ASIN: B0000CN58A.
[43] Hawkes P.W. and Kasper E. 1996. Principles of Electron Optics, Vol. 1, Basic Geometrical Optics, Elsevier (present), Academic Press (original), ISBN 0-12-333341-5.
[44] Hawkes P.W. and Kasper E. 1989. Principles of Electron Optics, Vol. 2, Applied Geometrical Optics, Elsevier (present),
Academic Press (original), ISBN 0-12-333352-0.