40
S. J. Mukhopadhyay et al.
Fig. 2 a Schematic of the diode structure used for the analysis of Gummel and Blue [4], b variations of open-circuit noise spectral density with frequency for different bias current densities, and
c variations of noise measure with frequency
3 Substance Parameters and Design Strategy
The brief descriptions of the field-dependent and field-independent material parameters of Si, 3C-SiC, and type-IIb diamond have already been included in the earlier
S. J. Mukhopadhyay et al.
Fig. 2 a Schematic of the diode structure used for the analysis of Gummel and Blue [4], b variations of open-circuit noise spectral density with frequency for different bias current densities, and
c variations of noise measure with frequency
3 Substance Parameters and Design Strategy
The brief descriptions of the field-dependent and field-independent material parameters of Si, 3C-SiC, and type-IIb diamond have already been included in the earlier