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72. D. E. Nikonov and I. A. Young, Overview of Beyond-CMOS Devices and a Uniform
Methodology for Their Benchmarking, Proc. IEEE, 101(12) 2013.
Open Access This chapter is licensed under the terms of the Creative Commons Attribution 4.0
International License (http://creativecommons.org/licenses/by/4.0/), which permits use, sharing,
adaptation, distribution and reproduction in any medium or format, as long as you give appropriate
credit to the original author(s) and the source, provide a link to the Creative Commons licence and
indicate if changes were made.
The images or other third party material in this chapter are included in the chapter’s Creative
Commons licence, unless indicated otherwise in a credit line to the material. If material is not
included in the chapter’s Creative Commons licence and your intended use is not permitted by
statutory regulation or exceeds the permitted use, you will need to obtain permission directly from
the copyright holder.
V. Radeka
61. R. Acciarri et al., Noise Characterization and Filtering in the MicroBooNE Liquid Argon TPC,
JINST, 12:P08003, 2017, 1705.07341.
62. T. Hiramoto et al., Emerging Nanoscale Silicon devices Taking Advantage of Nanostructure
Physics, IBM J. Res. & Dev. 50(4/5) (2006) 411.
63. M. Haselman, S. Hauck, The Future of Integrated circuits: A Survey of Nanoelectronics, Proc.
IEEE 98(1) (2010) 11.
64. Int. J. High Speed Electron. Syst., Issue on Nanotubes and Nanowires, 16(4) (2006).
65. D.E. Nikonov, JSNM 21, 497 (2008).
66. F. Schwierz, Graphene Transistors: Status, Prospects, and Problems, Proc. IEEE, 101(7)
(2013) 1567.
67. D.D. Smith, Single Electron Devices, Int. J. High Speed Electron. Syst. 9(1) (1998) 165.
68. M.H. Devoret, R.J. Schoelkopf, Amplifying Quantum Signals with the Single-Electron Transistor, Nature 406(31 Aug) (2000) 1039.
69. R.P. Kraft et al., Soft X-ray Spectroscopy with Sub-Electron Readnoise Charge-Coupled
Devices, Nucl. Instrum. Meth. A 361 (1995) 372.
70. G. De Geronimo, P. O’Connor, A CMOS Detector Leakage Current Self-Adaptable Continuous
Reset System: Theoretical Analysis, Nucl. Instrum. Meth. A 421 (1999) 322.
71. P. O’Connor, G. De Geronimo, Prospects for Charge Sensitive Amplifiers in Scaled CMOS,
Nucl. Instrum. Meth. A 480 (2002) 713.
72. D. E. Nikonov and I. A. Young, Overview of Beyond-CMOS Devices and a Uniform
Methodology for Their Benchmarking, Proc. IEEE, 101(12) 2013.
Open Access This chapter is licensed under the terms of the Creative Commons Attribution 4.0
International License (http://creativecommons.org/licenses/by/4.0/), which permits use, sharing,
adaptation, distribution and reproduction in any medium or format, as long as you give appropriate
credit to the original author(s) and the source, provide a link to the Creative Commons licence and
indicate if changes were made.
The images or other third party material in this chapter are included in the chapter’s Creative
Commons licence, unless indicated otherwise in a credit line to the material. If material is not
included in the chapter’s Creative Commons licence and your intended use is not permitted by
statutory regulation or exceeds the permitted use, you will need to obtain permission directly from
the copyright holder.