Index
405
EBSD data, 77–79
four dimensional distribution, 79
parent grain microstructure, 77
polycrystalline microstructures, 76
statistical analysis, 78
two-point correlation function, 65–66
validation, 79–82
Statistics
characterization, 76, 324
CP, 75
interface strength distribution, 363–365
microstructure, 67
ODM, 65
parent grain microstructure, 77
SERVEs (see Statistically equivalent
representative volume elements
(SERVEs))
size and shape, 24
Structure-property relationships
epoxy systems, 268
ICME, 249
surrogate model, 251
Superalloy
and fatigue, 1–3
fatigue cracks, 3
M-SERVE (see M-SERVE)
Ni-based, 70–71
powder metallurgy, 1, 2
P-SERVE (see P-SERVE)
RVEs (see Representative volume element
(RVEs))
targeted 3D data, 11–12
3D data, 3–4
TriBeam microscope, 4–10
turbine disks, 1, 2
Synthetic microstructure generation, 29, 40,
142, 224, 226, 375–377, 389
T
Theory, 143, 289, 378, 379, 382
Three-dimensional characterization, 3, 98, 313,
382
Ti-6242Si pancake forging
processing characterization data, 45
registration and fusion, 45–48
zoning process histories, 41–45
Titanium, 19, 20, 40, 93, 110, 262, 264
Tomography, 3, 5, 7, 13, 23, 223, 254
Transverse cracking strength
analytical and numerical models, 330
calibration, 360–363
ceramic matrix composites, 264
continuous-fiber laminated composites, 349
fiber-pair stress concentration, 356–358
hybrid glass/carbon/epoxy composite, 350
IGFEM, 349, 350
initiation, 258
machine learning, 260
macroscopic stress-strain curve, 337
model testing, 360–363
pattern, 336
problem description, 351–356
shear lag model, 350
stress shielding, 359–360
TriBeam
CMOS-based EBSD cameras, 6
data usage, 10
femtosecond laser
ablation, 7
technique, 4
FIB-SEM
chamber, 4
dual beam, 94
serial section, 7
high-quality reconstruction, 9
3D
EBSD data, 8
nickel dataset, 5
thermo-mechanical properties, 6
wire EDM, 9
Two-point correlation function, 66, 258, 375,
376, 383
U
Uncertainty quantification, 168, 175, 181–184,
188
Uniform traction boundary condition (UTBC),
299, 300
V
Virtual microstructure model
automated image processing techniques, 60
generation method, 79–82
SEVM (see Statistically equivalent virtual
microstructures (SEVMs))
Virtual testing, 159
W
Weibull distribution, 352, 355, 363
X
Xe-plasma FIBs (PFIB), 4, 6, 94
405
EBSD data, 77–79
four dimensional distribution, 79
parent grain microstructure, 77
polycrystalline microstructures, 76
statistical analysis, 78
two-point correlation function, 65–66
validation, 79–82
Statistics
characterization, 76, 324
CP, 75
interface strength distribution, 363–365
microstructure, 67
ODM, 65
parent grain microstructure, 77
SERVEs (see Statistically equivalent
representative volume elements
(SERVEs))
size and shape, 24
Structure-property relationships
epoxy systems, 268
ICME, 249
surrogate model, 251
Superalloy
and fatigue, 1–3
fatigue cracks, 3
M-SERVE (see M-SERVE)
Ni-based, 70–71
powder metallurgy, 1, 2
P-SERVE (see P-SERVE)
RVEs (see Representative volume element
(RVEs))
targeted 3D data, 11–12
3D data, 3–4
TriBeam microscope, 4–10
turbine disks, 1, 2
Synthetic microstructure generation, 29, 40,
142, 224, 226, 375–377, 389
T
Theory, 143, 289, 378, 379, 382
Three-dimensional characterization, 3, 98, 313,
382
Ti-6242Si pancake forging
processing characterization data, 45
registration and fusion, 45–48
zoning process histories, 41–45
Titanium, 19, 20, 40, 93, 110, 262, 264
Tomography, 3, 5, 7, 13, 23, 223, 254
Transverse cracking strength
analytical and numerical models, 330
calibration, 360–363
ceramic matrix composites, 264
continuous-fiber laminated composites, 349
fiber-pair stress concentration, 356–358
hybrid glass/carbon/epoxy composite, 350
IGFEM, 349, 350
initiation, 258
machine learning, 260
macroscopic stress-strain curve, 337
model testing, 360–363
pattern, 336
problem description, 351–356
shear lag model, 350
stress shielding, 359–360
TriBeam
CMOS-based EBSD cameras, 6
data usage, 10
femtosecond laser
ablation, 7
technique, 4
FIB-SEM
chamber, 4
dual beam, 94
serial section, 7
high-quality reconstruction, 9
3D
EBSD data, 8
nickel dataset, 5
thermo-mechanical properties, 6
wire EDM, 9
Two-point correlation function, 66, 258, 375,
376, 383
U
Uncertainty quantification, 168, 175, 181–184,
188
Uniform traction boundary condition (UTBC),
299, 300
V
Virtual microstructure model
automated image processing techniques, 60
generation method, 79–82
SEVM (see Statistically equivalent virtual
microstructures (SEVMs))
Virtual testing, 159
W
Weibull distribution, 352, 355, 363
X
Xe-plasma FIBs (PFIB), 4, 6, 94
Précédent