3D Data for Fatigue in Superalloys
15
13. D. Texier, J.C. Stinville, M.P. Echlin, S. Pierret, P. Villechaise, T.M. Pollock, J. Cormier, Acta
Mater. 165, 241 (2019). https://doi.org/10.1016/j.actamat.2018.11.051
14. D. Texier, A.C. Gómez, S. Pierret, J.M. Franchet, T.M. Pollock, P. Villechaise, J. Cormier,
Metall. Mater. Trans. A 47(3), 1096 (2016). https://doi.org/10.1007/s11661-015-3291-8
15. J. Stinville, N. Vanderesse, F. Bridier, P. Bocher, T. Pollock, Acta Mater. 98, 29 (2015). https://
doi.org/10.1016/j.actamat.2015.07.016
16. C.A. Stein, A. Cerrone, T. Ozturk, S. Lee, P. Kenesei, H. Tucker, R. Pokharel, J. Lind,
C. Hefferan, R.M. Suter, A.R. Ingraffea, A.D. Rollett, Curr. Opin. Solid State Mater. Sci.
18(4), 244 (2014). https://doi.org/10.1016/j.cossms.2014.06.001
17. S. Torquato, Random Heterogeneous Materials (Springer New York, 2002). https://doi.org/
10.1007/978-1-4757-6355-3
18. E.E. Underwood, in Microstructural Analysis (Springer US, 1973), pp. 35–66. https://doi.org/
10.1007/978-1-4615-8693-7_3
19. R.T. DeHoff, J. Microsc. 131(3), 259 (1983). https://doi.org/10.1111/j.1365-2818.1983.
tb04254.x
20. M.D. Uchic, M.A. Groeber, D.M. Dimiduk, J. Simmons, Scr. Mater. 55(1), 23 (2006). https://
doi.org/10.1016/j.scriptamat.2006.02.039
21. M.N. Kelly, K. Glowinski, N.T. Nuhfer, G.S. Rohrer, Acta Mater. 111, 22 (2016). https://doi.
org/10.1016/j.actamat.2016.03.029
22. K. Glowinski, A. Morawiec, Metall. Mater. Trans. A 45(8), 3189 (2014). https://doi.org/10.
1007/s11661-014-2325-y
23. G.S. Rohrer, V. Randle, in Electron Backscatter Diffraction in Materials Science (Springer
US, 2009), pp. 215–229. https://doi.org/10.1007/978-0-387-88136-2_16
24. M.P. Echlin, M. Straw, S. Randolph, J. Filevich, T.M. Pollock, Mater. Charact. 100, 1 (2015).
https://doi.org/10.1016/j.matchar.2014.10.023
25. M.P. Echlin, A. Mottura, C.J. Torbet, T.M. Pollock, Rev. Sci. Instrum. 83(2), 023701 (2012).
https://doi.org/10.1063/1.3680111
26. B.L. Boyce, M.D. Uchic, MRS Bull. 44(4), 273 (2019). https://doi.org/10.1557/mrs.2019.75
27. M. Uchic, M. Groeber, J. Spowart, M. Shah, M. Scott, P. Callahan, A. Shiveley, M. Chapman,
An automated multi-modal serial sectioning system for characterization of grain-scale
microstructures in engineering materials. Report # afrl-rx-wp-tp-2012-0254, Air Force
Research Labs (2012)
28. J. Rowenhorst, L. Nguyen, R.W. Fonda, Microsc. Microanal. 24(S1), 552 (2018). https://doi.
org/10.1017/s1431927618003252
29. L. Nguyen, D. Rowenhorst, Microsc. Microanal. 23(S1), 354 (2017). https://doi.org/10.1017/
s1431927617002458
30. B. Winiarski, A. Gholinia, K. Mingard, M. Gee, G. Thompson, P. Withers, Ultramicroscopy
172, 52 (2017). https://doi.org/10.1016/j.ultramic.2016.10.014
31. G. West, R. Thomson, J. Microsc. 233(3), 442 (2009). https://doi.org/10.1111/j.1365-2818.
2009.03138.x
32. S.J. Dillon, G.S. Rohrer, J. Am. Ceram. Soc. 92(7), 1580 (2009). https://doi.org/10.1111/j.
1551-2916.2009.03064.x
33. L. Holzer, M. Cantoni, Nanofabrication Using Focused Ion and Electron beams: Principles
and Applications, 559201222, pp. 410–435. Oxford University Press. edited by Ivo Utke,
Stanislav Moshkalev, Phillip Russell. (2012) ISBN: 0199920990
34. T. Burnett, R. Kelley, B. Winiarski, L. Contreras, M. Daly, A. Gholinia, M. Burke, P. Withers,
Ultramicroscopy 161, 119 (2016). https://doi.org/10.1016/j.ultramic.2015.11.001
35. A. Zankel, J. Wagner, P. Poelt, Micron 62, 66 (2014). https://doi.org/10.1016/j.micron.2014.
03.002
36. T. Hashimoto, G.E. Thompson, X. Zhou, P.J. Withers, Ultramicroscopy 163, 6 (2016). https://
doi.org/10.1016/j.ultramic.2016.01.005
37. J. Baruchel, G. Peix, J. Buffiere, E. Maire, P. Merle, X-Ray Tomography in Material Science
(Hermes Science, 2000). https://books.google.com/books?id=keAe_sdyBlQC
15
13. D. Texier, J.C. Stinville, M.P. Echlin, S. Pierret, P. Villechaise, T.M. Pollock, J. Cormier, Acta
Mater. 165, 241 (2019). https://doi.org/10.1016/j.actamat.2018.11.051
14. D. Texier, A.C. Gómez, S. Pierret, J.M. Franchet, T.M. Pollock, P. Villechaise, J. Cormier,
Metall. Mater. Trans. A 47(3), 1096 (2016). https://doi.org/10.1007/s11661-015-3291-8
15. J. Stinville, N. Vanderesse, F. Bridier, P. Bocher, T. Pollock, Acta Mater. 98, 29 (2015). https://
doi.org/10.1016/j.actamat.2015.07.016
16. C.A. Stein, A. Cerrone, T. Ozturk, S. Lee, P. Kenesei, H. Tucker, R. Pokharel, J. Lind,
C. Hefferan, R.M. Suter, A.R. Ingraffea, A.D. Rollett, Curr. Opin. Solid State Mater. Sci.
18(4), 244 (2014). https://doi.org/10.1016/j.cossms.2014.06.001
17. S. Torquato, Random Heterogeneous Materials (Springer New York, 2002). https://doi.org/
10.1007/978-1-4757-6355-3
18. E.E. Underwood, in Microstructural Analysis (Springer US, 1973), pp. 35–66. https://doi.org/
10.1007/978-1-4615-8693-7_3
19. R.T. DeHoff, J. Microsc. 131(3), 259 (1983). https://doi.org/10.1111/j.1365-2818.1983.
tb04254.x
20. M.D. Uchic, M.A. Groeber, D.M. Dimiduk, J. Simmons, Scr. Mater. 55(1), 23 (2006). https://
doi.org/10.1016/j.scriptamat.2006.02.039
21. M.N. Kelly, K. Glowinski, N.T. Nuhfer, G.S. Rohrer, Acta Mater. 111, 22 (2016). https://doi.
org/10.1016/j.actamat.2016.03.029
22. K. Glowinski, A. Morawiec, Metall. Mater. Trans. A 45(8), 3189 (2014). https://doi.org/10.
1007/s11661-014-2325-y
23. G.S. Rohrer, V. Randle, in Electron Backscatter Diffraction in Materials Science (Springer
US, 2009), pp. 215–229. https://doi.org/10.1007/978-0-387-88136-2_16
24. M.P. Echlin, M. Straw, S. Randolph, J. Filevich, T.M. Pollock, Mater. Charact. 100, 1 (2015).
https://doi.org/10.1016/j.matchar.2014.10.023
25. M.P. Echlin, A. Mottura, C.J. Torbet, T.M. Pollock, Rev. Sci. Instrum. 83(2), 023701 (2012).
https://doi.org/10.1063/1.3680111
26. B.L. Boyce, M.D. Uchic, MRS Bull. 44(4), 273 (2019). https://doi.org/10.1557/mrs.2019.75
27. M. Uchic, M. Groeber, J. Spowart, M. Shah, M. Scott, P. Callahan, A. Shiveley, M. Chapman,
An automated multi-modal serial sectioning system for characterization of grain-scale
microstructures in engineering materials. Report # afrl-rx-wp-tp-2012-0254, Air Force
Research Labs (2012)
28. J. Rowenhorst, L. Nguyen, R.W. Fonda, Microsc. Microanal. 24(S1), 552 (2018). https://doi.
org/10.1017/s1431927618003252
29. L. Nguyen, D. Rowenhorst, Microsc. Microanal. 23(S1), 354 (2017). https://doi.org/10.1017/
s1431927617002458
30. B. Winiarski, A. Gholinia, K. Mingard, M. Gee, G. Thompson, P. Withers, Ultramicroscopy
172, 52 (2017). https://doi.org/10.1016/j.ultramic.2016.10.014
31. G. West, R. Thomson, J. Microsc. 233(3), 442 (2009). https://doi.org/10.1111/j.1365-2818.
2009.03138.x
32. S.J. Dillon, G.S. Rohrer, J. Am. Ceram. Soc. 92(7), 1580 (2009). https://doi.org/10.1111/j.
1551-2916.2009.03064.x
33. L. Holzer, M. Cantoni, Nanofabrication Using Focused Ion and Electron beams: Principles
and Applications, 559201222, pp. 410–435. Oxford University Press. edited by Ivo Utke,
Stanislav Moshkalev, Phillip Russell. (2012) ISBN: 0199920990
34. T. Burnett, R. Kelley, B. Winiarski, L. Contreras, M. Daly, A. Gholinia, M. Burke, P. Withers,
Ultramicroscopy 161, 119 (2016). https://doi.org/10.1016/j.ultramic.2015.11.001
35. A. Zankel, J. Wagner, P. Poelt, Micron 62, 66 (2014). https://doi.org/10.1016/j.micron.2014.
03.002
36. T. Hashimoto, G.E. Thompson, X. Zhou, P.J. Withers, Ultramicroscopy 163, 6 (2016). https://
doi.org/10.1016/j.ultramic.2016.01.005
37. J. Baruchel, G. Peix, J. Buffiere, E. Maire, P. Merle, X-Ray Tomography in Material Science
(Hermes Science, 2000). https://books.google.com/books?id=keAe_sdyBlQC