A Framework for Quantifying Effects of Characterization Error on the. . .
247
7. S. Zaefferer, S. Wright, D. Raabe, Three-dimensional orientation microscopy in a focused
ion beam–scanning electron microscope: a new dimension of microstructure characterization.
Metall. Mater. Trans. A 39(2), 374–389 (2008)
8. J. Guyon, N. Gey, D. Goran, S. Chalal, F. Pérez-Willard, Advancing fib assisted 3D EBSD
using a static sample setup. Ultramicroscopy 161, 161–167 (2016)
9. T.L. Burnett, R. Kelley, B. Winiarski, L. Contreras, M. Daly, A. Gholinia, M.G. Burke, P.J.
Withers, Large volume serial section tomography by Xe plasma FIB dual beam microscopy.
Ultramicroscopy 161, 119–129 (2016)
10. S. Monteiro, S. Paciornik, From historical backgrounds to recent advances in 3D characterization of materials: an overview. JOM 69(1), 84–92 (2017)
11. M. Echlin, A. Mottura, C.J. Torbet, T. Pollock, A new tribeam system for three-dimensional
multimodal materials analysis. Rev. Sci. Instrum. 83(2), 023701 (2012)
12. M. Uchic, L. Holzer, B. Inkson, E. Principe, P. Munroe, Three-dimensional microstructural
characterization using focused ion beam tomography. MRS Bull. 32(5), 408–416 (2007)
13. W.C. Lenthe, Twin related domains in polycrystalline nickel-base superalloys: 3D structure and
fatigue. Ph.D. thesis, UCSB. Copyright – database copyright ProQuest LLC; ProQuest does not
claim copyright in the individual underlying works; Last updated – 28 Apr 2018 (2017)
14. F. Rhines, K. Craig, D. Rousse, Measurement of average grain volume and certain topological
parameters by serial section analysis. Metall. Trans. A 7(11), 1729–1734 (1976). Cited By 31
15. T.H. Hoang, M. Guerich, J. Yvonnet, Determining the size of RVE for nonlinear random
composites in an incremental computational homogenization framework. J. Eng. Mech. 142(5),
04016018 (2016)
16. M. Pinz, G. Weber, W.C. Lenthe, M.D. Uchic, T.M. Pollock, S. Ghosh, Microstructure and
property based statistically equivalent RVEs for intragranular γ – γ microstructures of Nibased superalloys. Acta Mater. 157, 245–258 (2018)
17. K. Teferra, L. Graham-Brady, A random field-based method to estimate convergence of
apparent properties in computational homogenization. Comput. Methods Appl. Mech. Eng.
330, 253–270 (2018)
18. M. Groeber, S. Ghosh, M. Uchic, D. Dimiduk, A framework for automated analysis and
simulation of 3D polycrystalline microstructures: part 1: statistical characterization. Acta
Mater. 56(6), 1257–1273 (2008)
19. G. Loughnane, M. Groeber, M. Uchic, M. Shah, R. Srinivasan, R. Grandhi, Modeling the effect
of voxel resolution on the accuracy of phantom grain ensemble statistics. Mater. Charact. 90,
136–150 (2014)
20. F. Ram, S. Wright, S. Singh, M. De Graef, Error analysis of the crystal orientations obtained
by the dictionary approach to EBSD indexing. Ultramicroscopy 181, 17–26 (2017)
21. G. Spanos, J. Allison, B. Cowles, J. DeLoach, T. Pollock, Implementing integrated computational materials engineering (ICME) in the aerospace, automotive, and maritime industries.
Technical report, The Minerals, Metals, and Materials Society, http://www.tms.org/icmestudy
(2013)
22. M. Groeber, M. Jackson, Dream.3D: a digital representation environment for the analysis of
microstructure in 3D. Integr. Mater. Manuf. Innov. 3(1), 5 (2014)
23. Dassault Systèmes. Abaqus (2017)
24. K. Teferra, L.Graham-Brady, Tessellation growth models for polycrystalline microstructures.
Comput. Mater. Sci. 102, 57–67 (2015)
25. BlueQuartz, http://dream3d.bluequartz.net/. Dream.3D User Manual – Erode/Dilate Bad Data
26. J. Goldstein, D. Newbury, J. Michae, N. Ritchie, J. Scott, D. Joy, Scanning Electron Microscopy
and X-Ray Microanalysis (Springer, New York, 2018)
27. K. Kanaya, S. Okayama Penetration and energy-loss theory of electrons in solid targets. J.
Phys. D Appl. Phys. 5(1), 43 (1972)
28. V. Randle, Electron backscatter diffraction: strategies for reliable data acquisition and processing. Mater. Charact. 60(9), 913–922 (2009)
247
7. S. Zaefferer, S. Wright, D. Raabe, Three-dimensional orientation microscopy in a focused
ion beam–scanning electron microscope: a new dimension of microstructure characterization.
Metall. Mater. Trans. A 39(2), 374–389 (2008)
8. J. Guyon, N. Gey, D. Goran, S. Chalal, F. Pérez-Willard, Advancing fib assisted 3D EBSD
using a static sample setup. Ultramicroscopy 161, 161–167 (2016)
9. T.L. Burnett, R. Kelley, B. Winiarski, L. Contreras, M. Daly, A. Gholinia, M.G. Burke, P.J.
Withers, Large volume serial section tomography by Xe plasma FIB dual beam microscopy.
Ultramicroscopy 161, 119–129 (2016)
10. S. Monteiro, S. Paciornik, From historical backgrounds to recent advances in 3D characterization of materials: an overview. JOM 69(1), 84–92 (2017)
11. M. Echlin, A. Mottura, C.J. Torbet, T. Pollock, A new tribeam system for three-dimensional
multimodal materials analysis. Rev. Sci. Instrum. 83(2), 023701 (2012)
12. M. Uchic, L. Holzer, B. Inkson, E. Principe, P. Munroe, Three-dimensional microstructural
characterization using focused ion beam tomography. MRS Bull. 32(5), 408–416 (2007)
13. W.C. Lenthe, Twin related domains in polycrystalline nickel-base superalloys: 3D structure and
fatigue. Ph.D. thesis, UCSB. Copyright – database copyright ProQuest LLC; ProQuest does not
claim copyright in the individual underlying works; Last updated – 28 Apr 2018 (2017)
14. F. Rhines, K. Craig, D. Rousse, Measurement of average grain volume and certain topological
parameters by serial section analysis. Metall. Trans. A 7(11), 1729–1734 (1976). Cited By 31
15. T.H. Hoang, M. Guerich, J. Yvonnet, Determining the size of RVE for nonlinear random
composites in an incremental computational homogenization framework. J. Eng. Mech. 142(5),
04016018 (2016)
16. M. Pinz, G. Weber, W.C. Lenthe, M.D. Uchic, T.M. Pollock, S. Ghosh, Microstructure and
property based statistically equivalent RVEs for intragranular γ – γ microstructures of Nibased superalloys. Acta Mater. 157, 245–258 (2018)
17. K. Teferra, L. Graham-Brady, A random field-based method to estimate convergence of
apparent properties in computational homogenization. Comput. Methods Appl. Mech. Eng.
330, 253–270 (2018)
18. M. Groeber, S. Ghosh, M. Uchic, D. Dimiduk, A framework for automated analysis and
simulation of 3D polycrystalline microstructures: part 1: statistical characterization. Acta
Mater. 56(6), 1257–1273 (2008)
19. G. Loughnane, M. Groeber, M. Uchic, M. Shah, R. Srinivasan, R. Grandhi, Modeling the effect
of voxel resolution on the accuracy of phantom grain ensemble statistics. Mater. Charact. 90,
136–150 (2014)
20. F. Ram, S. Wright, S. Singh, M. De Graef, Error analysis of the crystal orientations obtained
by the dictionary approach to EBSD indexing. Ultramicroscopy 181, 17–26 (2017)
21. G. Spanos, J. Allison, B. Cowles, J. DeLoach, T. Pollock, Implementing integrated computational materials engineering (ICME) in the aerospace, automotive, and maritime industries.
Technical report, The Minerals, Metals, and Materials Society, http://www.tms.org/icmestudy
(2013)
22. M. Groeber, M. Jackson, Dream.3D: a digital representation environment for the analysis of
microstructure in 3D. Integr. Mater. Manuf. Innov. 3(1), 5 (2014)
23. Dassault Systèmes. Abaqus (2017)
24. K. Teferra, L.Graham-Brady, Tessellation growth models for polycrystalline microstructures.
Comput. Mater. Sci. 102, 57–67 (2015)
25. BlueQuartz, http://dream3d.bluequartz.net/. Dream.3D User Manual – Erode/Dilate Bad Data
26. J. Goldstein, D. Newbury, J. Michae, N. Ritchie, J. Scott, D. Joy, Scanning Electron Microscopy
and X-Ray Microanalysis (Springer, New York, 2018)
27. K. Kanaya, S. Okayama Penetration and energy-loss theory of electrons in solid targets. J.
Phys. D Appl. Phys. 5(1), 43 (1972)
28. V. Randle, Electron backscatter diffraction: strategies for reliable data acquisition and processing. Mater. Charact. 60(9), 913–922 (2009)