122
D. W. Eastman et al.
23. P.A. Shade et al., Experimental measurement of surface strains and local lattice rotations
combined with 3D microstructure reconstruction from deformed polycrystalline ensembles at
the micro-scale. Integr. Mater. Manuf. Innov. 2(1), 5 (2013)
24. T. Turner et al., The influence of microstructure on surface strain distributions in a nickel
micro-tension specimen. Model. Simul. Mater. Sci. Eng. 21(1), 015002 (2012)
25. L. Kwakman et al., Sample preparation strategies for fast and effective failure analysis of
3D devices, in 39th International Symposium for Testing and Failure Analysis, San Jose,
California, 2013
26. Y. Xiao et al., Investigation of the deformation behavior of aluminum micropillars produced
by focused ion beam machining using Ga and Xe ions. Scr. Mater. 127, 191–194 (2017)
27. T.L. Burnett et al., Large volume serial section tomography by Xe plasma FIB dual beam
microscopy. Ultramicroscopy 161, 119–129 (2016)
28. M.P. Echlin et al., A new TriBeam system for three-dimensional multimodal materials
analysis. Rev. Sci. Instrum. 83(2), 023701 (2012)
29. J. Stinville et al., A combined grain scale elastic–plastic criterion for identification of fatigue
crack initiation sites in a twin containing polycrystalline nickel-base superalloy. Acta Mater.
103, 461–473 (2016)
30. H.F. Poulsen, Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and
Their Dynamics, vol 205 (Springer Science & Business Media, New York, NY, 2004)
31. U. Lienert et al., High-energy diffraction microscopy at the advanced photon source. JOM
63(7), 70–77 (2011)
32. H.F. Poulsen et al., Three-dimensional maps of grain boundaries and the stress state of
individual grains in polycrystals and powders. J. Appl. Crystallogr. 34(6), 751–756 (2001)
33. J.V. Bernier et al., Far-field high-energy diffraction microscopy: a tool for intergranular
orientation and strain analysis. J. Strain Anal. Eng. Design 46(7), 527–547 (2011)
34. H.F. Poulsen et al., Three-dimensional maps of grain boundaries and the stress state of
individual grains in polycrystals and powders. J. Appl. Crystallogr. 34(6), 751–756 (2001)
35. E.M. Lauridsen et al., Tracking: a method for structural characterization of grains in powders
or polycrystals. J. Appl. Crystallogr. 34(6), 744–750 (2001)
36. S. Li, R. Suter, Adaptive reconstruction method for three-dimensional orientation imaging. J.
Appl. Crystallogr. 46(2), 512–524 (2013)
37. R. Suter et al., Forward modeling method for microstructure reconstruction using x-ray
diffraction microscopy: single-crystal verification. Rev. Sci. Instrum. 77(12), 123905 (2006)
38. L. Margulies et al., Strain tensor development in a single grain in the bulk of a polycrystal
under loading. Acta Mater. 50(7), 1771–1779 (2002)
39. J. Oddershede et al., Determining grain resolved stresses in polycrystalline materials using
three-dimensional X-ray diffraction. J. Appl. Crystallogr. 43(3), 539–549 (2010)
40. P.A. Shade et al., A rotational and axial motion system load frame insert for in situ high
energy x-ray studies. Rev. Sci. Instrum. 86(9), 093902 (2015)
41. J.C. Schuren et al., New opportunities for quantitative tracking of polycrystal responses in
three dimensions. Curr. Opinion Solid State Mater. Sci. 19(4), 235–244 (2015)
42. T.J. Turner et al., Crystal plasticity model validation using combined high-energy diffraction
microscopy data for a Ti-7Al specimen. Metall. Mater. Trans. A 48(2), 627–647 (2017)
43. K. Hemker, W. Sharpe Jr., Microscale characterization of mechanical properties. Annu. Rev.
Mater. Res. 37, 93–126 (2007)
44. H. Espinosa, B. Prorok, M. Fischer, A methodology for determining mechanical properties of
freestanding thin films and MEMS materials. J. Mech. Phys. Solids 51(1), 47–67 (2003)
45. H. Espinosa, B. Prorok, B. Peng, Plasticity size effects in free-standing submicron polycrystalline FCC films subjected to pure tension. J. Mech. Phys. Solids 52(3), 667–689 (2004)
46. M. Haque, M. Saif, In-situ tensile testing of nano-scale specimens in SEM and TEM. Exp.
Mech. 42(1), 123–128 (2002)
47. S. Greek, S.A. Johansson, Tensile testing of thin-film microstructures, in Micromachined
Devices and Components III, (International Society for Optics and Photonics, Bellingham,
WA, 1997)
D. W. Eastman et al.
23. P.A. Shade et al., Experimental measurement of surface strains and local lattice rotations
combined with 3D microstructure reconstruction from deformed polycrystalline ensembles at
the micro-scale. Integr. Mater. Manuf. Innov. 2(1), 5 (2013)
24. T. Turner et al., The influence of microstructure on surface strain distributions in a nickel
micro-tension specimen. Model. Simul. Mater. Sci. Eng. 21(1), 015002 (2012)
25. L. Kwakman et al., Sample preparation strategies for fast and effective failure analysis of
3D devices, in 39th International Symposium for Testing and Failure Analysis, San Jose,
California, 2013
26. Y. Xiao et al., Investigation of the deformation behavior of aluminum micropillars produced
by focused ion beam machining using Ga and Xe ions. Scr. Mater. 127, 191–194 (2017)
27. T.L. Burnett et al., Large volume serial section tomography by Xe plasma FIB dual beam
microscopy. Ultramicroscopy 161, 119–129 (2016)
28. M.P. Echlin et al., A new TriBeam system for three-dimensional multimodal materials
analysis. Rev. Sci. Instrum. 83(2), 023701 (2012)
29. J. Stinville et al., A combined grain scale elastic–plastic criterion for identification of fatigue
crack initiation sites in a twin containing polycrystalline nickel-base superalloy. Acta Mater.
103, 461–473 (2016)
30. H.F. Poulsen, Three-Dimensional X-Ray Diffraction Microscopy: Mapping Polycrystals and
Their Dynamics, vol 205 (Springer Science & Business Media, New York, NY, 2004)
31. U. Lienert et al., High-energy diffraction microscopy at the advanced photon source. JOM
63(7), 70–77 (2011)
32. H.F. Poulsen et al., Three-dimensional maps of grain boundaries and the stress state of
individual grains in polycrystals and powders. J. Appl. Crystallogr. 34(6), 751–756 (2001)
33. J.V. Bernier et al., Far-field high-energy diffraction microscopy: a tool for intergranular
orientation and strain analysis. J. Strain Anal. Eng. Design 46(7), 527–547 (2011)
34. H.F. Poulsen et al., Three-dimensional maps of grain boundaries and the stress state of
individual grains in polycrystals and powders. J. Appl. Crystallogr. 34(6), 751–756 (2001)
35. E.M. Lauridsen et al., Tracking: a method for structural characterization of grains in powders
or polycrystals. J. Appl. Crystallogr. 34(6), 744–750 (2001)
36. S. Li, R. Suter, Adaptive reconstruction method for three-dimensional orientation imaging. J.
Appl. Crystallogr. 46(2), 512–524 (2013)
37. R. Suter et al., Forward modeling method for microstructure reconstruction using x-ray
diffraction microscopy: single-crystal verification. Rev. Sci. Instrum. 77(12), 123905 (2006)
38. L. Margulies et al., Strain tensor development in a single grain in the bulk of a polycrystal
under loading. Acta Mater. 50(7), 1771–1779 (2002)
39. J. Oddershede et al., Determining grain resolved stresses in polycrystalline materials using
three-dimensional X-ray diffraction. J. Appl. Crystallogr. 43(3), 539–549 (2010)
40. P.A. Shade et al., A rotational and axial motion system load frame insert for in situ high
energy x-ray studies. Rev. Sci. Instrum. 86(9), 093902 (2015)
41. J.C. Schuren et al., New opportunities for quantitative tracking of polycrystal responses in
three dimensions. Curr. Opinion Solid State Mater. Sci. 19(4), 235–244 (2015)
42. T.J. Turner et al., Crystal plasticity model validation using combined high-energy diffraction
microscopy data for a Ti-7Al specimen. Metall. Mater. Trans. A 48(2), 627–647 (2017)
43. K. Hemker, W. Sharpe Jr., Microscale characterization of mechanical properties. Annu. Rev.
Mater. Res. 37, 93–126 (2007)
44. H. Espinosa, B. Prorok, M. Fischer, A methodology for determining mechanical properties of
freestanding thin films and MEMS materials. J. Mech. Phys. Solids 51(1), 47–67 (2003)
45. H. Espinosa, B. Prorok, B. Peng, Plasticity size effects in free-standing submicron polycrystalline FCC films subjected to pure tension. J. Mech. Phys. Solids 52(3), 667–689 (2004)
46. M. Haque, M. Saif, In-situ tensile testing of nano-scale specimens in SEM and TEM. Exp.
Mech. 42(1), 123–128 (2002)
47. S. Greek, S.A. Johansson, Tensile testing of thin-film microstructures, in Micromachined
Devices and Components III, (International Society for Optics and Photonics, Bellingham,
WA, 1997)