Microscale Testing and Characterization
Techniques for Benchmarking Crystal
Plasticity Models at Microstructural
Length Scales
David W. Eastman, Paul A. Shade, Michael D. Uchic, and Kevin J. Hemker
1 Introduction
The desire to improve the performance and lifetime of polycrystalline components
has fueled the development of advanced micromechanical modeling tools. Multiscale modeling approaches, such as Crystal Plasticity Finite Element Methods
(CPFEM), now possess the ability to illuminate the link between material processing, microstructure, and properties [1]. Whereas traditional FE modeling relies on
convergent macroscale properties, the ability of CPFEM to explicitly represent the
morphology and local crystallographic orientations of polycrystalline microstructures requires scale-specific, quantitative microstructural information for both input
and validation. The development and implementation of experimental techniques for
capturing behavior and microstructural properties at salient length scales are needed
to inform the determination of representative volume elements (RVEs). Here,
accurately capturing microstructural details and observing size effects on material
properties are both important. Simply extrapolating from average microstructure
descriptors does not provide information about the relative importance of specific
grain size, shape, and configuration with neighbors. These are features that can be
captured experimentally through advanced characterization techniques, such as 3D
serial sectioning [2].
Whereas traditional modeling efforts have made use of existing data in the
literature to model a certain material behavior, the inverse, namely, designing
and tailoring experiments to obtain local microstructurally specific benchmarks,
D. W. Eastman () · K. J. Hemker ()
Department of Mechanical Engineering, Johns Hopkins University, Baltimore, MD, USA
e-mail: deastma2@jhu.edu; hemker@jhu.edu
P. A. Shade · M. D. Uchic
Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB,
Dayton, OH, USA
© Springer Nature Switzerland AG 2020
S. Ghosh et al. (eds.), Integrated Computational Materials Engineering (ICME),
https://doi.org/10.1007/978-3-030-40562-5_4
91
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