464
Compact Models for Integrated Circuit Design
* variation by instance
.param gnsigma=globalnsigma*(globalmcflag==1)/3
.param gpsigma=globalpsigma*(globalmcflag==1)/3
.param sdvtpcorn = 0
.param sdvtncorn = 0
.LIB ‘sram127hp.l’ SUBCKTS_SVT
.endl MC_svt
.LIB SUBCKTS_SVT
*************************************************************
* Subcircuit references
*************************************************************
*
* weff = w/nf
* wnflag = 1 size bin w/nf
* wnflag = 0 size bin w
*
* fixed nf=1 and use instance mult factor to capture folding
* setting instance of these subckts with parameter nf!=1 have
no effect
* area/peri default calculation assumes nf=1
* DEVICE: PULL UP
.subckt p4_pu_svt D G S B
.param w=0 l=0 z=0.100e-6 multi=1
.param pd=’2*(w+z)’ ad=’w*z’
.param ps=’2*(w+z)’ as=’w*z’
.param pw=’2*((2*z)+l+w)’ aw=’((2*z)+l)*w’
.param lw=’(2*z)+l’
.param n_fingers=1
.param mismatchflag=0
.param avtp=2.8e-09
** must make default sigmavt=0, ie, no instance parameter
** sdvtp/ncorn in TT,SS,... takes care of corners sigvt when
** globalsigmavtflag=1
.param sigmavt=0
.param delvto=0
** systematic **
** instance based sampling of systematic variation
** g[pn]mean varying in lock step for each instance
** defined in calling library MC_svt using globap[np]mean and
** global[np]meansigma
** existing global[np]sigma varies by instance and is defined by