4.2 Cathode Ray Tube Subcategory
Table 4.48 shows pretreatment standards which any existing source under the
cathode ray tube subcategory that introduces pollutants into a Publicly Owned
Treatment Works (POTWs) must achieve.
Under the regulations for new source performance standards (NSPS), a new
source subject to the cathode ray tube subcategory must achieve the following
standard as presented in Table 4.49.
Any new source of the cathode ray tube subcategory that introduces pollutants
into a POTWs must achieve the under listed pretreatment standards for new sources
(PSNS) in Table 4.50.
4.3 Semiconductor Subcategory
The degree of effluent reduction achievable by the application of the best practicable
control technology (BPT) currently available for the semiconductor subcategory is
presented in Table 4.51.
The new source performance standards for the semiconductor subcategory are
given in Table 4.52 and any new source must achieve the standard stated therein.
In the application of the best conventional pollution control technology (BCT),
the degree of effluent reduction attainable is documented in Table 4.53, and any
existing point source subjected to the semiconductor subcategory must achieve this
standard.
Table 4.47 New source performance standard (NSPS) for
luminescent material
subcategory
Pollutant
One day (mg/L)
Monthly average (mg/L)
pH
6.00–9.00
6.00–9.00
Cadmium
0.55
0.26
Antimony
0.10
0.04
Zinc
1.64
0.67
Fluoride
35.0
18.0
TSS
60.0
31.0
Source: [26]
Table 4.48 Pretreatment standards for existing sources (PSES) for cathode ray tube subcategory
Pollutant
One day (mg/L)
Monthly average (mg/L)
Total toxic organic
1.58
–
Cadmium
0.06
0.03
Chromium
0.65
0.30
Lead
1.12
0.41
Zinc
1.38
0.56
Fluoride
35.0
18.0
Source: [26]
4 Electrical and Electronic Wastes Treatment
187
Table 4.48 shows pretreatment standards which any existing source under the
cathode ray tube subcategory that introduces pollutants into a Publicly Owned
Treatment Works (POTWs) must achieve.
Under the regulations for new source performance standards (NSPS), a new
source subject to the cathode ray tube subcategory must achieve the following
standard as presented in Table 4.49.
Any new source of the cathode ray tube subcategory that introduces pollutants
into a POTWs must achieve the under listed pretreatment standards for new sources
(PSNS) in Table 4.50.
4.3 Semiconductor Subcategory
The degree of effluent reduction achievable by the application of the best practicable
control technology (BPT) currently available for the semiconductor subcategory is
presented in Table 4.51.
The new source performance standards for the semiconductor subcategory are
given in Table 4.52 and any new source must achieve the standard stated therein.
In the application of the best conventional pollution control technology (BCT),
the degree of effluent reduction attainable is documented in Table 4.53, and any
existing point source subjected to the semiconductor subcategory must achieve this
standard.
Table 4.47 New source performance standard (NSPS) for
luminescent material
subcategory
Pollutant
One day (mg/L)
Monthly average (mg/L)
pH
6.00–9.00
6.00–9.00
Cadmium
0.55
0.26
Antimony
0.10
0.04
Zinc
1.64
0.67
Fluoride
35.0
18.0
TSS
60.0
31.0
Source: [26]
Table 4.48 Pretreatment standards for existing sources (PSES) for cathode ray tube subcategory
Pollutant
One day (mg/L)
Monthly average (mg/L)
Total toxic organic
1.58
–
Cadmium
0.06
0.03
Chromium
0.65
0.30
Lead
1.12
0.41
Zinc
1.38
0.56
Fluoride
35.0
18.0
Source: [26]
4 Electrical and Electronic Wastes Treatment
187