References
299
[55] J. Orloff, editor. Handbook of Charged Particle Optics. CRC Press,
Taylor & Francis Group, London, second edition, 2009.
[56] J. Picht. Beitr¨ age zur Theorie der geometrischen Elektronenoptik.
Annalen der Physik, 407(8):926–964, 1932.
[57] J. R. Pierce. Rectilinear electron flow in beams. Journal of Applied
Physics, 11:548–554, 1940.
[58] M. Reiser. Theory and Design of Charged Particle Beams. Wiley-VCH,
Weinheim, second edition, 2008.
[59] H. Rose. Historical aspects of aberration correction. Journal of Electron
Microscopy, 58(3):77–85, 2009.
[60] H. Rose. Geometrical Charged-Particle Optics. Springer-Verlag, Berlin,
second edition, 2012.
[61] Y. Sasaki and S. Maruse. ¨
Uber die Arbeitsweise und die elektronenoptischen Eigenschaften der Spitzenkathode. In G. M¨ ollenstedt, H. Niehrs,
and E. Ruska, editors, Physikalisch-Technischer Teil, Band 1, pages 9–
13. Springer-Verlag, 1960. Fourth International Conference on Electron
Microscopy, Berlin 1958.
[62] O. Scherzer. ¨
Uber einige Fehler von Elektronenlinsen. Zeitschrift f¨ ur
Physik, 101(9–10):593–603, 1936.
[63] A. Septier, editor. Applied Charged Particle Optics. Academic Press,
New York, 1980, 1983. Part A, B, C.
[64] D. H. Sloan and E. O. Lawrence. Production of heavy high speed ions
without the use of high voltages. Physical Review, 38:2021–2032, 1931.
https://journals.aps.org/pr/abstract/10.1103/PhysRev.38.2021.
[65] C. Steier. Private communication for the lattice data of the Advanced
Light Source at Lawrence Berkeley National Laboratory.
[66] V. Suller. Private communication for the lattice data of the storage at
Center for Advanced Microstructures and Devices at Louisiana State
University.
[67] M. Szilagyi. Electron and Ion Optics. Plenum Press, New York, 1988.
[68] R. M. Tromp, J. B. Hannon, A. W. Ellis, W. Wan, A. Berghaus, and
O. Schaff. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. Ultramicroscopy, 110:852–861, 2010.
[69] V. Veksler. A new method of acceleration of relativistic particles. Journal
of Physics (Moscow), 9(3):153, 1945.
[70] T. P. Wangler. RF Linear Accelerators. Wiley-VCH, Weinheim, second
edition, 2008.
299
[55] J. Orloff, editor. Handbook of Charged Particle Optics. CRC Press,
Taylor & Francis Group, London, second edition, 2009.
[56] J. Picht. Beitr¨ age zur Theorie der geometrischen Elektronenoptik.
Annalen der Physik, 407(8):926–964, 1932.
[57] J. R. Pierce. Rectilinear electron flow in beams. Journal of Applied
Physics, 11:548–554, 1940.
[58] M. Reiser. Theory and Design of Charged Particle Beams. Wiley-VCH,
Weinheim, second edition, 2008.
[59] H. Rose. Historical aspects of aberration correction. Journal of Electron
Microscopy, 58(3):77–85, 2009.
[60] H. Rose. Geometrical Charged-Particle Optics. Springer-Verlag, Berlin,
second edition, 2012.
[61] Y. Sasaki and S. Maruse. ¨
Uber die Arbeitsweise und die elektronenoptischen Eigenschaften der Spitzenkathode. In G. M¨ ollenstedt, H. Niehrs,
and E. Ruska, editors, Physikalisch-Technischer Teil, Band 1, pages 9–
13. Springer-Verlag, 1960. Fourth International Conference on Electron
Microscopy, Berlin 1958.
[62] O. Scherzer. ¨
Uber einige Fehler von Elektronenlinsen. Zeitschrift f¨ ur
Physik, 101(9–10):593–603, 1936.
[63] A. Septier, editor. Applied Charged Particle Optics. Academic Press,
New York, 1980, 1983. Part A, B, C.
[64] D. H. Sloan and E. O. Lawrence. Production of heavy high speed ions
without the use of high voltages. Physical Review, 38:2021–2032, 1931.
https://journals.aps.org/pr/abstract/10.1103/PhysRev.38.2021.
[65] C. Steier. Private communication for the lattice data of the Advanced
Light Source at Lawrence Berkeley National Laboratory.
[66] V. Suller. Private communication for the lattice data of the storage at
Center for Advanced Microstructures and Devices at Louisiana State
University.
[67] M. Szilagyi. Electron and Ion Optics. Plenum Press, New York, 1988.
[68] R. M. Tromp, J. B. Hannon, A. W. Ellis, W. Wan, A. Berghaus, and
O. Schaff. A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design. Ultramicroscopy, 110:852–861, 2010.
[69] V. Veksler. A new method of acceleration of relativistic particles. Journal
of Physics (Moscow), 9(3):153, 1945.
[70] T. P. Wangler. RF Linear Accelerators. Wiley-VCH, Weinheim, second
edition, 2008.
