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field optical microscopy down to the ~30 nm scale. Unlike more time-consuming
near-field optical techniques, the described far-field 2D imaging allows very simple,
fast, robust, and straightforward image acquisition. Widespread availability of these
techniques to the research community should bring about numerous advances in
imaging, lithography, and sensing. However, metamaterial losses remain an important performance-limiting issue. It remains to be seen if loss compensation using
gain media [31] will be able to overcome this problem.
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