4. To specify the location of the beam center in a dataset, use the
values calculated in step 2 as the inputs for origin parameters in
the XDS.INP file.
5. Enter the correct relativistic wavelength of the incident electron beam as the X-RAY_WAVELENGTH. This parameter is
dependent on the specific accelerating voltage employed by the
instrument (see Note 16).
Fig. 3 Sample workflow for structure determination via direct methods.
Subheading 3.3 covers diffraction; Subheading 3.4 covers indexing and
integration; Subheading 3.5 covers merging, scaling, and format conversion;
Subheading 3.6 covers direct methods and refinement
MicroED of Small Macromolecules
337